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Optical systems degradation, contamination, and stray light: effects, measurements, and control : 2-5 August 2004, Denver, Colorado, USA

Optical systems degradation, contamination, and stray light: effects, measurements, and control : 2-5 August 2004, Denver, Colorado, USA
Paper図書
Philip T. C. Chen, John C. Fleming, Michael G. Dittman, chairs/editors ; sponsored and published by SPIE--the International Society for Optical EngineeringSPIEc2004
Other Libraries in Japan
  • Author HeadingChen, Philip T. C. Fleming, John C. Dittman, Mic...

Optical system contamination : effects, measurements, and control VII : 9-11 July 2002, Seattle, USA

Optical system contamination : effects, measurements, and control VII : 9-11 July 2002, Seattle, USA
Paper図書
Philip T.C. Chen, O. Manuel Uy chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering ; cooperating organizations, The Boeing Company (USA) ... [et al.]SPIEc2002
Other Libraries in Japan
  • Author HeadingSociety of Photo-optical Instrumentation Engineers Chen, Philip T. C. Uy, O. Manuel

Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado pbk.

Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado pbk.
Paper図書
Philip T. C. Chen, Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored and pubslished by SPIE--The International Society for Optical EngineeringSPIE1999
Other Libraries in Japan
  • Author HeadingChen, Philip T. C. Gu, Zu-Han Maradudin, A. A. S...

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