Jump to main content

yr 〜
yr

Search results 4

Low electron beam energy CIVA analysis of passivated ICs SAND-94-1167C DE94 017421 CONF-9411541

Low electron beam energy CIVA analysis of passivated ICs SAND-94-1167C DE94 017421 CONF-9411541
Microform規格・テクニカルリポート類
Cole, E. I, Soden, J. M, Dodd, B. A, Henderson, C. L1994<LS-DE94/017421>
National Diet Library

LOW ELECTRON BEAM ENERGY CIVA ANALYSIS OF PASSIVATED ICS (SAND ; SAND-94-1167C)

LOW ELECTRON BEAM ENERGY CIVA ANALYSIS OF PASSIVATED ICS (SAND ; SAND-94-1167C)
Paper図書
COLE, E.I. JR.// SODEN, J.M.// DODD, B.A.// HENDERSON, C.L. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan
  • Author HeadingCOLE, E.I. JR. SODEN, J.M. DODD, B.A. HENDERSON, C.L.

MAGNETIC FORCE MICROSCOPY/CURRENT CONTRAST IMAGING: A NEW TECHNIQUE FOR INTERNAL CURRENT PROBING OF ICS (SAND ; SAND-93-1881C)

MAGNETIC FORCE MICROSCOPY/CURRENT CONTRAST IMAGING: A NEW TECHNIQUE FOR INTERNAL CURRENT PROBING OF ICS (SAND ; SAND-93-1881C)
Paper図書
CAMPBELL, A.N.// COLE, E.I. JR.// DODD, B.A.// ANDERSON, R.E. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan
  • Author HeadingCAMPBELL, A.N. COLE, E.I. JR. DODD, B.A. ANDERSON, R.E.

Internal current probing of integrated circuits using magnetic force microscopy (SAND ; SAND-92-2067C)

Internal current probing of integrated circuits using magnetic force microscopy (SAND ; SAND-92-2067C)
Paper図書
A.N. Campbell [et al.]Sandia National Labs.1992.12.
Other Libraries in Japan
  • Author HeadingCampbell, A.N. Cole, E.I. Jr. Dodd, B.A. Anderson, R.E.

Reached to the end of result.

RSS