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2006 international conference on design & test integrated systems in nanoscale technology : La Marsa, Tunisia : 5-7 September 2006. : Sep 2006, La Marsa, Tunisia.

2006 international conference on design & test integrated systems in nanoscale technology : La Marsa, Tunisia : 5-7 September 2006. : Sep 2006, La Marsa, Tunisia.
Paper図書
Institute of Electrical and Electronics Engineersc2006.<M17-07-2512>
National Diet Library
  • Author HeadingGirard, Patrick, Ph. D. International Conference on D...

Proceedings : third IEEE International Workshop on Electronic Design, Test, and Applications, 17-19 January 2006, Kuala Lumpur, Malaysia

Proceedings : third IEEE International Workshop on Electronic Design, Test, and Applications, 17-19 January 2006, Kuala Lumpur, Malaysia
Paper図書
edited by Patrick Girard, Adam Osseiran, and Moi-Tin Chew ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), IEEE Malaysia Section, Monash University, Malaysia ; with industrial co-sponsorship from National Instruments ; in cooperation with Freescale Semiconductor Malaysia ... [et al.]IEEE Computer Societyc2006
Other Libraries in Japan
  • Author Heading...d Applications Girard, Patrick, Ph. D. Osseiran, Adam Chew, Moi-Tin

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