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TESTING METHODS FOR CUSTOM LSI CIRCUITS. (SAND ; SAND-81-0426C)

TESTING METHODS FOR CUSTOM LSI CIRCUITS. (SAND ; SAND-81-0426C)
Paper図書
GRAHAM, E.D. Jr.Sandia National Laboratories(Sandia National Laboratories)1981.
Other Libraries in Japan
  • Author HeadingGRAHAM, E.D. Jr.

Microwave transistors

Microwave transistors
Paper図書
E. D. Graham, Jr., C. W. GwynArtech Housec1975
Other Libraries in Japan

Large signal S-parameters: modeling and radiation effects in microwave power transistors (SLA ; SLA-73-5416) (CONF ; CONF-730828-2)

Large signal S-parameters: modeling and radiation effects in microwave power transistors (SLA ; SLA-73-5416) (CONF ; CONF-730828-2)
Paper図書
E.D. Graham, Jr, R.J. Chaffin, C.W. Gwyn1973
Other Libraries in Japan
  • Author HeadingGraham, E.D. Jr. Chaffin, R.J. Gwyn, C.W.

Device Degrdation from the Effects of Nuclear Radiation on passivation materials (SC ; SC-DC-721232)

Device Degrdation from the Effects of Nuclear Radiation on passivation materials (SC ; SC-DC-721232)
Paper図書
F.N. Coppage, E.D. Graham, Jr.Sandia Labs.1972.
Other Libraries in Japan
  • Author HeadingCoppage, F.N. Graham, E.D. Jr.

RADIATION EFFECTS IN MICROWAVE BIPOLAR TRANSISTORS. (SC ; SC-DC-721233)

RADIATION EFFECTS IN MICROWAVE BIPOLAR TRANSISTORS. (SC ; SC-DC-721233)
Paper図書
GRAHAM, E.D.JR.
Other Libraries in Japan

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