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Using federal technology policy to strength the US microelectronics industry SAND-94-1681 DE94 017293

Using federal technology policy to strength the US microelectronics industry SAND-94-1681 DE94 017293
Microform規格・テクニカルリポート類
Gover, J. E, Gwyn, C. W1994<LS-DE94/017293>
National Diet Library

USING FEDERAL TECHNOLOGY POLICY TO STRENGTH THE US MICROELECTRONICS INDUSTRY (SAND ; SAND-94-1681)

USING FEDERAL TECHNOLOGY POLICY TO STRENGTH THE US MICROELECTRONICS INDUSTRY (SAND ; SAND-94-1681)
Paper図書
GOVER, J.E.// GWYN, C.W. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan
  • Author HeadingGOVER, J.E. GWYN, C.W.

CUSTOM MOS LSI CIRCUIT DESIGN. (SAND ; SAND-81-0999C)

CUSTOM MOS LSI CIRCUIT DESIGN. (SAND ; SAND-81-0999C)
Paper図書
GWYN, C.W.Sandia National Laboratories(Sandia National Laboratories)1981.
Other Libraries in Japan
  • Author HeadingGWYN, C.W.

TUTORIAL ON DESIGN, FABRICATION, AND TESTING OF CUSTOM CMOS ICS. (SAND ; SAND-81-1579C)

TUTORIAL ON DESIGN, FABRICATION, AND TESTING OF CUSTOM CMOS ICS. (SAND ; SAND-81-1579C)
Paper図書
GWYN, C.W.Sandia National Laboratories(Sandia National Laboratories)1981.
Other Libraries in Japan
  • Author HeadingGWYN, C.W.

INTEGRATED CIRCUIT DESIGN USING DESIGN AUTOMATION. (SAND ; SAND-76-0572)

INTEGRATED CIRCUIT DESIGN USING DESIGN AUTOMATION. (SAND ; SAND-76-0572)
Paper図書
GWYN, C.W.Sandia National Laboratories(Sandia National Laboratories)1976.
Other Libraries in Japan
  • Author HeadingGWYN, C.W.

INTEGRATED SET OF COMPUTER AIDS FOR CUSTOMIC DESIGN. (SAND ; SAND-76-9216)

INTEGRATED SET OF COMPUTER AIDS FOR CUSTOMIC DESIGN. (SAND ; SAND-76-9216)
Paper図書
GWYN, C.W.Sandia National Laboratories(Sandia National Laboratories)1976.
Other Libraries in Japan
  • Author HeadingGWYN, C.W.

Microwave transistors

Microwave transistors
Paper図書
E. D. Graham, Jr., C. W. GwynArtech Housec1975
Other Libraries in Japan

RARadiation failure modes in CMOS integrated circuits (SLA ; SLA-73-5631) (CONF ; CONF-730703-4)

RARadiation failure modes in CMOS integrated circuits (SLA ; SLA-73-5631) (CONF ; CONF-730703-4)
Paper図書
R.A. Burghard, C.W. GwynSandia Labs.1973.7.
Other Libraries in Japan
  • Author HeadingBurghard, R.A. Gwyn, C.W.

Large signal S-parameters: modeling and radiation effects in microwave power transistors (SLA ; SLA-73-5416) (CONF ; CONF-730828-2)

Large signal S-parameters: modeling and radiation effects in microwave power transistors (SLA ; SLA-73-5416) (CONF ; CONF-730828-2)
Paper図書
E.D. Graham, Jr, R.J. Chaffin, C.W. Gwyn1973
Other Libraries in Japan
  • Author HeadingGraham, E.D. Jr. Chaffin, R.J. Gwyn, C.W.

ANALYSIS OF RADIATION EFFECTS IN SEMICONDUCTOR JUNCTION DEVICES. (CONF ; CONF-670708-3)

ANALYSIS OF RADIATION EFFECTS IN SEMICONDUCTOR JUNCTION DEVICES. (CONF ; CONF-670708-3)
Paper図書
Sandia Corp., Albuquerque, N. Mex.1967.
Other Libraries in Japan

IONIZING RADIATION EFFECTS IN MOS DEVICES. (SC ; SC-DC-68-2556)

IONIZING RADIATION EFFECTS IN MOS DEVICES. (SC ; SC-DC-68-2556)
Paper図書
GWYN, C.W.
Other Libraries in Japan
  • Author HeadingGWYN, C.W.

COMPUTER AIDED DESIGNS OF MOS INTEGRATED CIRCUITS. (SAND ; SAND-74-5544)

COMPUTER AIDED DESIGNS OF MOS INTEGRATED CIRCUITS. (SAND ; SAND-74-5544)
Paper図書
GWYN, C.W.Sandia National Laboratories(Sandia National Laboratories)
Other Libraries in Japan
  • Author HeadingGWYN, C.W.

ANALYSIS OF RADIATION EFFECTS IN SEMICONDUCTOR JUNCTION DEVICES. (SC ; SC-R-67-1158)

ANALYSIS OF RADIATION EFFECTS IN SEMICONDUCTOR JUNCTION DEVICES. (SC ; SC-R-67-1158)
Paper図書
GWYN, C.W.
Other Libraries in Japan
  • Author HeadingGWYN, C.W.

CARRIER TRAPPING EFFECTS IN IRRADIATED PN JUNCTIONS. (SC ; SC-DC-721237)

CARRIER TRAPPING EFFECTS IN IRRADIATED PN JUNCTIONS. (SC ; SC-DC-721237)
Paper図書
GWYN, C.W.
Other Libraries in Japan
  • Author HeadingGWYN, C.W.

ANALYSIS OF THE EFFECTS OF IONIZING RADIATION IN ONE-DIMENSIONAL METAL-OXIDE-SEMICONDUCTOR STRUCTURES.:FINAL REPORT. (SC ; SC-CR-68-3659)

ANALYSIS OF THE EFFECTS OF IONIZING RADIATION IN ONE-DIMENSIONAL METAL-OXIDE-SEMICONDUCTOR STRUCTURES.:FINAL REPORT. (SC ; SC-CR-68-3659)
Paper図書
GWYN, C.W.
Other Libraries in Japan
  • Author HeadingGWYN, C.W.

ANALYSIS OF IONIZING RADIATION EFFECTS IN FOUR-LAYER SEMICONDUCTOR DEVICES. (SC ; SC-DC-69-1673)

ANALYSIS OF IONIZING RADIATION EFFECTS IN FOUR-LAYER SEMICONDUCTOR DEVICES. (SC ; SC-DC-69-1673)
Paper図書
GWYN, C.W.
Other Libraries in Japan
  • Author HeadingGWYN, C.W.

COMPUTER PROGRAM FOR DAMAGE CORRELATION IN SILICON. (SC ; SC-RR-67-122)

COMPUTER PROGRAM FOR DAMAGE CORRELATION IN SILICON. (SC ; SC-RR-67-122)
Paper図書
GWYN, C.W.
Other Libraries in Japan
  • Author HeadingGWYN, C.W.

DESIGNING ULTRAHARD BIPOLAR TRANSISTORS. (SC ; SC-DC-713706)

DESIGNING ULTRAHARD BIPOLAR TRANSISTORS. (SC ; SC-DC-713706)
Paper図書
GWYN, C.W.
Other Libraries in Japan
  • Author HeadingGWYN, C.W.

RADIATION TOLERANCE OF MOS DEVICES. (SC ; SC-DC-68-2542)

RADIATION TOLERANCE OF MOS DEVICES. (SC ; SC-DC-68-2542)
Paper図書
GWYN, C.W.
Other Libraries in Japan
  • Author HeadingGWYN, C.W.

IONIZING RADIATION EFFECTS IN THE INSULATOR REGION OF MOS DEVICES. (SLA ; SLA-73-13)

IONIZING RADIATION EFFECTS IN THE INSULATOR REGION OF MOS DEVICES. (SLA ; SLA-73-13)
Paper図書
GWYN, C.W.
Other Libraries in Japan
  • Author HeadingGWYN, C.W.

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