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SEMICONDUCTOR MEASUREMENT TECHNOLOGY: NONDESTRUCTIVE TESTS USED TO INSURE THE INTEGRITY OF SEMICONDUCTOR DEVICES, WITHE EMPHASIS ON ACOUSTIC EMISSION TECHNIQUES. (PB ; PB80-101801; NBS-SP-400-59)
SEMICONDUCTOR MEASUREMENT TECHNOLOGY: NONDESTRUCTIVE TESTS USED TO INSURE THE INTEGRITY OF SEMICONDUCTOR DEVICES, WITHE EMPHASIS ON ACOUSTIC EMISSION TECHNIQUES. (PB ; PB80-101801; NBS-SP-400-59)
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HARMAN, G.G.
1979.
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Author Heading
HARMAN, G.G.
SEMICONDUCTOR MEASUREMENT TECHNOLOGY.:THE USE OF ACOUSTIC EMISSION TO DETERMINE THE INTEGRITY OF LARGE KOVAR GLASS-SEALE (PB ; PB82-234485; NBS-SP-400-70)
SEMICONDUCTOR MEASUREMENT TECHNOLOGY.:THE USE OF ACOUSTIC EMISSION TO DETERMINE THE INTEGRITY OF LARGE KOVAR GLASS-SEALE (PB ; PB82-234485; NBS-SP-400-70)
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HARMAN, G.G.
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HARMAN, G.G.
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