Jump to main content

yr 〜
yr

Search results 15

Feasibility of determining Pu-239 environmental and occupational levels in urinary excretion by fission track analysis DOE/NV/10865-T2 DE97 003786

Feasibility of determining Pu-239 environmental and occupational levels in urinary excretion by fission track analysis DOE/NV/10865-T2 DE97 003786
Microform規格・テクニカルリポート類
Krahenbuhl, M. P, Seiger-Webster, C. M, Henderson, C. L, Smith, R. B1997<LS-DE97/003786>
National Diet Library

Signature analysis method for IC failure analysis SAND-96-2102C DE96 014119 CONF-9611802

Signature analysis method for IC failure analysis SAND-96-2102C DE96 014119 CONF-9611802
Microform規格・テクニカルリポート類
Henderson, C. L, Soden, J. M1996<LS-DE96/014119>
National Diet Library

Failure analysis: Status and future trends SAND-95-0108C DE95 006311 CONF-9501171

Failure analysis: Status and future trends SAND-95-0108C DE95 006311 CONF-9501171
Microform規格・テクニカルリポート類
Anderson, R. E, Soden, J. M, Henderson, C. L1995<LS-DE95/006311>
National Diet Library

Procedures for the use of Lexan and Makrofol SSNTDs in the detection of environmental concentrations of (sup 235)U and (sup 239)Pu. Thesis (Ph.D.) DOE/NV/10865-T7 DE97 003783

Procedures for the use of Lexan and Makrofol SSNTDs in the detection of environmental concentrations of (sup 235)U and (sup 239)Pu. Thesis (Ph.D.) DOE/NV/10865-T7 DE97 003783
Microform規格・テクニカルリポート類
Henderson, C. L1993<LS-DE97/003783>
National Diet Library

Low electron beam energy CIVA analysis of passivated ICs SAND-94-1167C DE94 017421 CONF-9411541

Low electron beam energy CIVA analysis of passivated ICs SAND-94-1167C DE94 017421 CONF-9411541
Microform規格・テクニカルリポート類
Cole, E. I, Soden, J. M, Dodd, B. A, Henderson, C. L1994<LS-DE94/017421>
National Diet Library

SIGNATURE ANALYSIS METHOD FOR IC FAILURE ANALYSIS (SAND ; SAND-96-2102C)

SIGNATURE ANALYSIS METHOD FOR IC FAILURE ANALYSIS (SAND ; SAND-96-2102C)
Paper図書
HENDERSON,C.L. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES).)Sandia National Laboratories(Sandia National Laboratories)1996.
Other Libraries in Japan

FUTURE TECHNOLOGY CHALLENGES FOR FAILURE ANALYSIS (SAND ; SAND-95-0624C)

FUTURE TECHNOLOGY CHALLENGES FOR FAILURE ANALYSIS (SAND ; SAND-95-0624C)
Paper図書
ANDERSON, R.E.// SODEN, J.M.// HENDERSON, C.L. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1995.
Other Libraries in Japan
  • Author HeadingANDERSON, R.E. SODEN, J.M. HENDERSON, C.L.

ADVENT OF FAILURE ANALYSIS SOFTWARE TECHNOLOGY (SAND ; SAND-94-0402C)

ADVENT OF FAILURE ANALYSIS SOFTWARE TECHNOLOGY (SAND ; SAND-94-0402C)
Paper図書
HENDERSON, C.L.// BARNARD, R.D. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan
  • Author HeadingHENDERSON, C.L. BARNARD, R.D.

FAILURE ANALYSIS: STATUS AND FUTURE TRENDS (SAND ; SAND-95-0108C)

FAILURE ANALYSIS: STATUS AND FUTURE TRENDS (SAND ; SAND-95-0108C)
Paper図書
ANDERSON, R.E.// SODEN, J.M.// HENDERSON, C.L. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1995.
Other Libraries in Japan
  • Author HeadingANDERSON, R.E. SODEN, J.M. HENDERSON, C.L.

ADVANCED FAILURE ANALYSIS LABORATORY EQUIPMENT NETWORKING. (SAND ; SAND-93-1748C)

ADVANCED FAILURE ANALYSIS LABORATORY EQUIPMENT NETWORKING. (SAND ; SAND-93-1748C)
Paper図書
HENDERSON, C.L.// BARTON, D.L. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan
  • Author HeadingHENDERSON, C.L. BARTON, D.L.

LOW ELECTRON BEAM ENERGY CIVA ANALYSIS OF PASSIVATED ICS (SAND ; SAND-94-1167C)

LOW ELECTRON BEAM ENERGY CIVA ANALYSIS OF PASSIVATED ICS (SAND ; SAND-94-1167C)
Paper図書
COLE, E.I. JR.// SODEN, J.M.// DODD, B.A.// HENDERSON, C.L. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan
  • Author HeadingCOLE, E.I. JR. SODEN, J.M. DODD, B.A. HENDERSON, C.L.

NOVEL FAILURE ANALYSIS TECHNIQUES USING PHOTON PROBING WITH A SCANNING OPTICAL MICROSCOPE (SAND ; SAND-93-2429C)

NOVEL FAILURE ANALYSIS TECHNIQUES USING PHOTON PROBING WITH A SCANNING OPTICAL MICROSCOPE (SAND ; SAND-93-2429C)
Paper図書
COLE, E.I. JR.// SODEN, J.M.// RIFE, J.L.// BARTON, D.L.// HENDERSON, C.L. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan
  • Author HeadingCOLE, E.I. JR. SODEN, J.M. RIFE, J.L. BARTON, D.L. HENDERSON, C.L.

BEHAVIOR AND TESTING IMPLICATIONS OF CMOS IC LOGIC GATE OPEN CIRCUITS (SAND ; SAND-91-1726C)

BEHAVIOR AND TESTING IMPLICATIONS OF CMOS IC LOGIC GATE OPEN CIRCUITS (SAND ; SAND-91-1726C)
Paper図書
HENDERSON, C.L.// SODEN, J.M.// HAWKINS, C.F. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1991.
Other Libraries in Japan
  • Author HeadingHENDERSON, C.L. SODEN, J.M. HAWKINS, C.F.

CASE HISTORY: FAILURE ANALYSIS OF A CMOS SRAM WITH AN INTERMITTENT OPEN CONTACT (SAND ; SAND-91-0741C)

CASE HISTORY: FAILURE ANALYSIS OF A CMOS SRAM WITH AN INTERMITTENT OPEN CONTACT (SAND ; SAND-91-0741C)
Paper図書
CAMPBELL, A.N.// COLE, E.I. JR.// HENDERSON, C.L.// TAYLOR, M.R. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1991.
Other Libraries in Japan
  • Author HeadingCAMPBELL, A.N. COLE, E.I. JR. HENDERSON, C.L. TAYLOR, M.R.

Future technology challenges for failure analysis SAND-95-0624C DE95 016411 CONF-9511561

Future technology challenges for failure analysis SAND-95-0624C DE95 016411 CONF-9511561
Microform規格・テクニカルリポート類
Anderson, R. E, Soden, J. M. Henderson, C. L1995<LS-DE95/016411>
National Diet Library

Reached to the end of result.

RSS