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IN SITU X-RAY SCATTERING STUDY OF INCIPIENT FORMATION OF POROUS SILICON (ANL ; ANL/MSD/CP-86502)

IN SITU X-RAY SCATTERING STUDY OF INCIPIENT FORMATION OF POROUS SILICON (ANL ; ANL/MSD/CP-86502)
Paper図書
YOU, HOYDOO// HUANG, KEGANG// YOO, S.S.// NAGY, Z. (ARGONNE NATIONAL LAB., IL (UNITED STATES). MATERIALS SCIENCE DIV.)Argonne National Laboratory(Argonne National Laboratory)1995.
Other Libraries in Japan
  • Author HeadingYOU, HOYDOO HUANG, KEGANG YOO, S.S. NAGY, Z.

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