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18th IEEE VLSI test symposium : Apr 2000, Montreal, Canada.

18th IEEE VLSI test symposium : Apr 2000, Montreal, Canada.
Paper図書
IEEE Computer Society Press2000.<M17-00-1988>
National Diet Library

Proceedings : 25th IEEE VLSI Test Symposium : 6-10 May, 2007, Berkeley, California

Proceedings : 25th IEEE VLSI Test Symposium : 6-10 May, 2007, Berkeley, California
Paper図書
[sponsored by IEEE Computer Society Test Technology Technical Council]IEEE Computer Societyc2007
Other Libraries in Japan
  • Author HeadingIEEE VLSI Test Symposium IEEE Computer Society. Test Technology Technical Council

Proceedings : 24th IEEE VLSI Test Symposium : April 30-May 4, 2006, Berkeley, California

Proceedings : 24th IEEE VLSI Test Symposium : April 30-May 4, 2006, Berkeley, California
Paper図書
sponsored by IEEE Computer Society Test Technology Technical CouncilIEEE Computer Societyc2006
Other Libraries in Japan
  • Author HeadingIEEE VLSI Test Symposium IEEE Computer Society. Test Technology Technical Council

2008 IEEE International High Level Design Validation and Test Workshop : November 19-21, 2008, Incline Village, Nevada : proceedings

2008 IEEE International High Level Design Validation and Test Workshop : November 19-21, 2008, Incline Village, Nevada : proceedings
Paper図書
sponsored by IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Design Automation Technical CommitteeIEEE Computer Societyc2008
Other Libraries in Japan
  • Author Heading... Test Workshop IEEE Computer Society. Test Technology Technical Council IEEE Computer Society. Design...

Proceedings : 23rd IEEE VLSI Test Symposium : 1-5 May, 2005, Palm Springs, California

Proceedings : 23rd IEEE VLSI Test Symposium : 1-5 May, 2005, Palm Springs, California
Paper図書
sponsored by IEEE Computer Society Test Technology Technical Council (TTTC)IEEE Computer Societyc2005
Other Libraries in Japan
  • Author HeadingIEEE VLSI Test Symposium IEEE Computer Society. Test Technology Technical Council

Proceedings : fourth IEEE International Symposium on Electronic Design, Test, and Applications, 23-25 January 2008, Hong Kong, SAR, China

Proceedings : fourth IEEE International Symposium on Electronic Design, Test, and Applications, 23-25 January 2008, Hong Kong, SAR, China
Paper図書
editors, Adam Osseiran ... [et al.] ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), IEEE Hong Kong ED/SSC Joint Chapter, Hong Kong University of Science and TechnologyIEEE Computer Societyc2008
Other Libraries in Japan
  • Author Heading...Osseiran, Adam IEEE Computer Society. Test Technology Technical Council

Proceedings, 22nd IEEE VLSI Test Symposium : 25-29 April 2004, Napa Valley, California

Proceedings, 22nd IEEE VLSI Test Symposium : 25-29 April 2004, Napa Valley, California
Paper図書
sponsored by IEEE Computer Society Test Technology Technical CouncilIEEE Computer Societyc2004
Other Libraries in Japan
  • Author HeadingIEEE VLSI Test Symposium IEEE Computer Society. Test Technology Technical Council

Proceedings : 15th Asian Test Symposium : Fukuoka, Japan, November 20-23, 2006

Proceedings : 15th Asian Test Symposium : Fukuoka, Japan, November 20-23, 2006
Paper図書
IEEE Computer Societyc2006
Other Libraries in Japan
  • Author HeadingAsian Test Symposium IEEE Computer Society IEEE Computer Society. Test Technology Technical Council

Proceedings of the 16th Asian Test Symposium, 8-11 October 2007, Beijing, China

Proceedings of the 16th Asian Test Symposium, 8-11 October 2007, Beijing, China
Paper図書
sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), Institute of Computing Technology, Chinese Academy of Sciences ; in cooperation with Technical Committee on Fault Tolerant Computing of CCF, National Natural Science Foundation of China (NSFC)IEEE Computer Societyc2007
Other Libraries in Japan
  • Author HeadingAsian Test Symposium IEEE Computer Society. Test Technology Technical Council

Eleventh Annual IEEE International High-Level Design Validation and Test Workshop : November 8-10, 2006, Monterey, California : proceedings

Eleventh Annual IEEE International High-Level Design Validation and Test Workshop : November 8-10, 2006, Monterey, California : proceedings
Paper図書
sponsored by IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Design Automation Technical CommitteeIEEE Computer Societyc2006
Other Libraries in Japan
  • Author Heading... Test Workshop IEEE Computer Society. Test Technology Technical Council IEEE Computer Society. Design...

Proceedings 14th Asian Test Symposium, Calcutta, India, December 18-21, 2005

Proceedings 14th Asian Test Symposium, Calcutta, India, December 18-21, 2005
Paper図書
IEEE Computer Societyc2005
Other Libraries in Japan
  • Author HeadingAsian Test Symposium IEEE Computer Society IEEE Computer Society. Test Technology Technical Council

Proceedings, 21st IEEE VLSI Test Symposium (VTS 2003) : 27 April-1 May 2003, Napa Valley, California

Proceedings, 21st IEEE VLSI Test Symposium (VTS 2003) : 27 April-1 May 2003, Napa Valley, California
Paper図書
sponsored by IEEE Computer Society Test Technology Technical CouncilIEEE Computer Societyc2003
Other Libraries in Japan
  • Author HeadingIEEE VLSI Test Symposium IEEE Computer Society. Test Technology Technical Council

Tenth Annual IEEE International High-Level Design Validation and Test Workshop : November 30 - December 2, 2005, Napa Valley, California : proceedings : pbk

Tenth Annual IEEE International High-Level Design Validation and Test Workshop : November 30 - December 2, 2005, Napa Valley, California : proceedings : pbk
Paper図書
sponsored by IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Design Automation Technical CommitteeIEEE Computer Societyc2005
Other Libraries in Japan
  • Author Heading... Test Workshop IEEE Computer Society. Test Technology Technical Council IEEE Computer Society. Design...

2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan

2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan
Paper図書
IEEE Computer Society Test Technology Technical Council ; co-sponsored by National Tsing Hua UniversityIEEE Computer Societyc2005
Other Libraries in Japan
  • Author Heading...n, and Testing IEEE Computer Society. Test Technology Technical Council 清華大学

Proceedings : International Test Conference 2004

Proceedings : International Test Conference 2004
Paper図書
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]International Test Conferencec2004
Other Libraries in Japan
  • Author HeadingInternational Test Conference IEEE Computer Society. Test Technology Technical Council Institute of Electrical and E...

2005 IEEE International Test Conference (ITC), 8-10 Novermber, 2005, Austin, TX : [set]

2005 IEEE International Test Conference (ITC), 8-10 Novermber, 2005, Austin, TX : [set]
Paper図書
Institute of Electrical and Electronics Engineersc2005
Other Libraries in Japan
  • Author HeadingInternational Test Conference IEEE Computer Society. Test Technology Technical Council Institute of Electrical and E...

Proceedings, 13th Asian Test Symposium : Kenting, Taiwan, November 15-17, 2004

Proceedings, 13th Asian Test Symposium : Kenting, Taiwan, November 15-17, 2004
Paper図書
[sponsored by IEEE Computer Society Test Technology Technical Council ; co-sponsored by National Tsing Hua University]IEEE Computer Societyc2004
Other Libraries in Japan
  • Author HeadingAsian Test Symposium IEEE Computer Society. Test Technology Technical Council Kuo li chʿing hua ta hsüeh (H...

Proceedings, 20th IEEE VLSI Test Symposium (VTS 2002) : 28 April-2 May 2002, Monterey, California

Proceedings, 20th IEEE VLSI Test Symposium (VTS 2002) : 28 April-2 May 2002, Monterey, California
Paper図書
sponsored by IEEE Computer Society Test Technology Technical CouncilIEEE Computer Societyc2002
Other Libraries in Japan
  • Author HeadingIEEE VLSI Test Symposium IEEE Computer Society. Test Technology Technical Council

Proceedings : International Test Conference 2003

Proceedings : International Test Conference 2003
Paper図書
[sponsored by IEEE Computer Society, Test Technology Technical Council and IEEE Philadelphia Section]International Test Conferencec2003
Other Libraries in Japan
  • Author HeadingInternational Test Conference IEEE Computer Society. Test Technology Technical Council Institute of Electrical and E...

Proceedings, 9th IEEE International On-Line Testing Symposium : IOLTS 2003, 7-9 July 2003, Kos International Convention Center, Kos Island, Greece

Proceedings, 9th IEEE International On-Line Testing Symposium : IOLTS 2003, 7-9 July 2003, Kos International Convention Center, Kos Island, Greece
Paper図書
edited by C. Metra ... [et al.] ; sponsored by IEEE Computer Society Test Technology Technical CouncilIEEE Computer Society2003
Other Libraries in Japan
  • Author Heading..., C. (Cecilia) IEEE Computer Society. Test Technology Technical Council
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