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Terrestrial radiation effects in ULSI devices and electronic systems
Terrestrial radiation effects in ULSI devices and electronic systems
Paper
図書
Eishi H. Ibe
Wiley
2015
Other Libraries in Japan
Author Heading
Ibe, Eishi H.
Dependability in electronic systems : mitigation of hardware failures, soft errors, and electro-magnetic disturbances
Dependability in electronic systems : mitigation of hardware failures, soft errors, and electro-magnetic disturbances
Paper
図書
Nobuyasu Kanekawa ... [et al.]
Springer
c2011
Other Libraries in Japan
Author Heading
Kanekawa, Nobuyasu
Ibe, Eishi H.
Suga, Takashi Uematsu, Yutaka
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