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Advanced measurement and test IV : selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China : pbk

Advanced measurement and test IV : selected, peer reviewed papers from the 2014 4th International Conference on Advanced Measurement and Test, (AMT 2014), November 1-2, 2014, Wuhan, China : pbk
Paper図書
edited by Ankdrew Parvel and Andy WuTrans Tech Publicationsc2015
Other Libraries in Japan
  • Author HeadingInternational Conference on Advanced Measurement and Test Parvel, Ankdrew Wu, Andy

Advanced measurement and test III : selected, peer reviewed papers from the 2013 3rd International Conference on Advanced Measurement and Test (AMT 2013), Xiamen, China, 13-14 March 2013 : [set]

Advanced measurement and test III : selected, peer reviewed papers from the 2013 3rd International Conference on Advanced Measurement and Test (AMT 2013), Xiamen, China, 13-14 March 2013 : [set]
Paper図書
editors, Andy WuTrans Tech Publications2013
Other Libraries in Japan
  • Author HeadingInternational Conference on Advanced Measurement and Test Wu, Andy

Progress in measurement and testing : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China :[set]

Progress in measurement and testing : selected, peer reviewed papers from the 2010 International Conference on Advanced Measurement and Test (AMT 2010), May 15-16, 2010, Sanya, P.R. China :[set]
Paper図書
edited by Yanwen WuTrans Tech Publicationsc2010
Other Libraries in Japan
  • Author HeadingInternational Conference on Advanced Measurement and Test Wu, Yanwen

Advanced measurement and test : selected, peer reviewed papers from the 2011 2nd International Conference on Advanced Measurement and Test (AMT 2011), June 24-26, 2011, Nanchang, China : [set]

Advanced measurement and test : selected, peer reviewed papers from the 2011 2nd International Conference on Advanced Measurement and Test (AMT 2011), June 24-26, 2011, Nanchang, China : [set]
Paper図書
edited by Riza Esa and Yanwen WuTrans Tech Publicationsc2011
Other Libraries in Japan
  • Author HeadingInternational Conference on Advanced Measurement and Test Esa, Riza Wu, Yanwen

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