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ELECTRON YIELD XAFS STUDY OF EVAPORATED CO/PD MULTILAYERS WITH VARIOUS THICKNESS RATIOS OF CO TO PD SUBLAYERS: SIMULATIONS OF THE CO K-EDGE XAFS AND FOURIER TRANSFORMS (BNL ; BNL-48084)

ELECTRON YIELD XAFS STUDY OF EVAPORATED CO/PD MULTILAYERS WITH VARIOUS THICKNESS RATIOS OF CO TO PD SUBLAYERS: SIMULATIONS OF THE CO K-EDGE XAFS AND FOURIER TRANSFORMS (BNL ; BNL-48084)
Paper図書
CHOI, M.// JOO, J.H.// KIM, S.K.// KANG, J.S.// LEE, Y.P.// SHIN, S.C.// HEALD, S.M. (BROOKHAVEN NATIONAL LAB., UPTON, NY (UNITED STATES))Brookhaven National Laboratory(Brookhaven National Laboratory)1992.
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  • Author HeadingCHOI, M. JOO, J.H. KIM, S.K. KANG, J.S. LEE, Y.P...

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