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Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A. / editors, Noble M. Johnson, Stephen G. Bishop, George D. Watkins. (Materials Research Society symposia proceedings ; v. 46)

Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A. / editors, Noble M. Johnson, Stephen G. Bishop, George D. Watkins. (Materials Research Society symposia proceedings ; v. 46)
Paper図書
Materials Research Societyc1985.<M15-A4582>
National Diet LibraryOther Libraries in Japan
  • Author HeadingJohnson, Noble M. Bishop, Stephen G. Watkins, G...

Energy beam-solid interactions and transient thermal processing : symposium held November 1983 in Boston, Massachusetts, U.S.A. / editors, John C.C. Fan, Noble M. Johnson. (Materials Research Society symposia proceedings ; v. 23)

Energy beam-solid interactions and transient thermal processing : symposium held November 1983 in Boston, Massachusetts, U.S.A. / editors, John C.C. Fan, Noble M. Johnson. (Materials Research Society symposia proceedings ; v. 23)
Paper図書
North-Hollandc1984.<M15-A2055>
National Diet LibraryOther Libraries in Japan
  • Author HeadingFan, John C. C. Johnson, Noble M.

Hydrogen in semiconductors [1] 2

Hydrogen in semiconductors [1] 2
Paper図書
volume editors, Jacques I. Pankove, Noble M. JohnsonAcademic Pressc1991-1999
Other Libraries in Japan
  • Author HeadingPankove, Jacques I. Johnson, Noble M. Nickel, Norbert H.

Energy beam-solid interactions and transient thermal processing : symposium held November 1983 in Boston, Massachusetts, U.S.A.

Energy beam-solid interactions and transient thermal processing : symposium held November 1983 in Boston, Massachusetts, U.S.A.
Paper図書
editors, John C.C. Fan, Noble M. JohnsonNorth-Hollandc1984
Other Libraries in Japan
  • Author HeadingFan, John C. C. Johnson, Noble M.

Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.

Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.
Paper図書
editors, Noble M. Johnson, Stephen G. Bishop, George D. WatkinsMaterials Research Societyc1985
Other Libraries in Japan
  • Author HeadingJohnson, Noble M. Bishop, Stephen G. Watkins, G...

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