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SEM microcharacterization of semiconductors / edited by D.B. Holt, D.C. Joy. (Techniques of physics ; 12)

SEM microcharacterization of semiconductors / edited by D.B. Holt, D.C. Joy. (Techniques of physics ; 12)
Paper図書
Academic Pressc1989.<ND371-A21>
National Diet Library
  • Author HeadingHolt, D. B. Joy, David C., 1943-

EXAFS spectroscopy, techniques and applications / edited by B.K. Teo and D.C. Joy.

EXAFS spectroscopy, techniques and applications / edited by B.K. Teo and D.C. Joy.
Paper図書
Plenum Pressc1981.<M15-A4739>
National Diet Library
  • Author HeadingTeo, B. K. Joy, David C., 1943- Materials Research Society.

Microscopy of semiconducting materials, 1981 : proceedings of the Royal Microscopical Society Conference held in St. Catherine's College, Oxford, 6-10 April 1981 / Edited by A. G. Cullis and D. C. Joy. (Conference series ; no. 60)

Microscopy of semiconducting materials, 1981 : proceedings of the Royal Microscopical Society Conference held in St. Catherine's College, Oxford, 6-10 April 1981 / Edited by A. G. Cullis and D. C. Joy. (Conference series ; no. 60)
Paper図書
The Institute of Physicsc1981.<MC151-48>
National Diet Library
  • Author HeadingCullis, A. G. Joy, David C., 1943- Royal Microscopical Society (...

Introduction to analytical electron microscopy / edited by John J. Hren, Joseph I. Goldstein, and David C. Joy.

Introduction to analytical electron microscopy / edited by John J. Hren, Joseph I. Goldstein, and David C. Joy.
Paper図書
Plenum Pressc1979.<ND448-28>
National Diet Library
  • Author Heading... Joseph, 1939- Joy, David C., 1943- Electron Microscopy Society o...

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