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Sputter roughening instability on the Ge(001) surface: Energy and flux dependence SAND-95-1454C DE96 003650 CONF-95115516

Sputter roughening instability on the Ge(001) surface: Energy and flux dependence SAND-95-1454C DE96 003650 CONF-95115516
Microform規格・テクニカルリポート類
Chason, E, Mayer, T. M, Kellerman, B. K1995<LS-DE96/003650>
National Diet Library

Smoothing during ion-assisted growth by transient ion beam-induced defects SAND-95-0850C DE95 011021 CONF-9504127

Smoothing during ion-assisted growth by transient ion beam-induced defects SAND-95-0850C DE95 011021 CONF-9504127
Microform規格・テクニカルリポート類
Kellerman, B. K, Chason, E, Floro, J. A, Picraux, S. T, White, J. M1995<LS-DE95/011021>
National Diet Library

Defect production and recombination during low-energy ion processing SAND-94-1280C DE95 001827 CONF-9410013

Defect production and recombination during low-energy ion processing SAND-94-1280C DE95 001827 CONF-9410013
Microform規格・テクニカルリポート類
Kellerman, B. K, Floro, J. A, Chason, E, Brice, D. K, Picraux, S. T1994<LS-DE95/001827>
National Diet Library

SPUTTER ROUGHENING INSTABILITY ON THE GE(001) SURFACE: ENERGY AND FLUX DEPENDENCE (SAND ; SAND-95-1454C)

SPUTTER ROUGHENING INSTABILITY ON THE GE(001) SURFACE: ENERGY AND FLUX DEPENDENCE (SAND ; SAND-95-1454C)
Paper図書
CHASON, E.// MAYER, T.M.// KELLERMAN, B.K. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1995.
Other Libraries in Japan
  • Author HeadingCHASON, E. MAYER, T.M. KELLERMAN, B.K.

SMOOTHING DURING ION-ASSISTED GROWTH BY TRANSIENT ION BEAMINDUCED DEFECTS (SAND ; SAND-95-0850C)

SMOOTHING DURING ION-ASSISTED GROWTH BY TRANSIENT ION BEAMINDUCED DEFECTS (SAND ; SAND-95-0850C)
Paper図書
KELLERMAN, B.K.// CHASON, E.// FLORO, J.A.// PICRAUX, S.T.// WHITE, J.M. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1995.
Other Libraries in Japan
  • Author HeadingKELLERMAN, B.K. CHASON, E. FLORO, J.A. PICRAU...

DEFECT PRODUCTION AND RECOMBINATION DURING LOW-ENERGY ION PROCESSING (SAND ; SAND-94-1280C)

DEFECT PRODUCTION AND RECOMBINATION DURING LOW-ENERGY ION PROCESSING (SAND ; SAND-94-1280C)
Paper図書
KELLERMAN, B.K.// FLORO, J.A.// CHASON, E.// BRICE, D.K.// PICRAUX, S.T.// WHITE, J.M. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan
  • Author HeadingKELLERMAN, B.K. FLORO, J.A. CHASON, E. BRICE,...

INTRA-CASCADE SURFACE RECOMBINATION OF POINT DEFECTS DURING ION BOMBARDMENT OF GE (001) (SAND ; SAND-94-0357C)

INTRA-CASCADE SURFACE RECOMBINATION OF POINT DEFECTS DURING ION BOMBARDMENT OF GE (001) (SAND ; SAND-94-0357C)
Paper図書
FLORO, J.A.// KELLERMAN, B.K.// CHASON, E.// PICRAUX, S.T.// BRICE, D.K.// HORN, K.M. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan
  • Author HeadingFLORO, J.A. KELLERMAN, B.K. CHASON, E. PICRAUX, S.T. BRIC...

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