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INFLUENCE OF GRAIN STRUCTURE ON THE RELIABILITY OF NARROW ALBASED INTERCONNECTS (UCRL ; UCRL-JC-120336)

INFLUENCE OF GRAIN STRUCTURE ON THE RELIABILITY OF NARROW ALBASED INTERCONNECTS (UCRL ; UCRL-JC-120336)
Paper図書
KANG, S.H.// KIM, C.L MORRIS, J.W. JR.// GENIN, F.Y. (LAWRENCE LIVERMORE NATIONAL LAB., CA (UNITED STATES))University of California Research Laboratory(University of California Research Laboratory)1995.
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  • Author HeadingKANG, S.H. KIM, C.L MORRIS, J.W. JR. GENIN, F.Y.

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