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Radiation damage annealing effects at elevated temperatures in bipolar transistors for severe space environments (SAND ; SAND-87-0446C; CONF-870575-2; DE87006706)

Radiation damage annealing effects at elevated temperatures in bipolar transistors for severe space environments (SAND ; SAND-87-0446C; CONF-870575-2; DE87006706)
Paper図書
Thome, F.V., Luker, S.M.Sandia National Labs.1987.1.
Other Libraries in Japan
  • Author HeadingThome, F.V. Luker, S.M.

MULTIPLEXER/AMPLIFIER TEST RESULTS FOR SP-100 (SAND ; SAND-90-2730C)

MULTIPLEXER/AMPLIFIER TEST RESULTS FOR SP-100 (SAND ; SAND-90-2730C)
Paper図書
KING, D.B.// LUKER, S.M.// RYAN, R.(SANDIA NATIONAL LABS., ALBUQUERQUE, NM(USA))Sandia National Laboratories(Sandia National Laboratories)1990.
Other Libraries in Japan
  • Author HeadingKING, D.B. LUKER, S.M. RYAN, R.

The effects of high temperature and total dose gamma radiation on a power MOSFET (metal-oxide semiconductor field effect transistor) (N-channel) and an operational amplifier (Sandia report ; SAND-86-2719C; CONF-870575-1; DE87006710)

The effects of high temperature and total dose gamma radiation on a power MOSFET (metal-oxide semiconductor field effect transistor) (N-channel) and an operational amplifier (Sandia report ; SAND-86-2719C; CONF-870575-1; DE87006710)
Paper図書
Wheelis, W.T., Luker, S.M.Sandia National Labs.1987.01.
Other Libraries in Japan
  • Author HeadingWheelis, W.T. Luker, S.M.

Capabilities and diagnostics of the Sandia Pelletron-raster system (SAND ; SAND-84-0912)

Capabilities and diagnostics of the Sandia Pelletron-raster system (SAND ; SAND-84-0912)
Paper図書
Sandia National Laboratories(Sandia National Laboratories)1984.
Other Libraries in Japan
  • Author HeadingBuckalew, W.H. Lockwood, G.J. Luker, S.M. Ruggles, L.E. Wyant, F.J.

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