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Electrical performance tests for audio distortion analyzers / O.B. Laug, G.N. Stenbakken, and T.F. Leedy ; prepared for U.S. Army Communications Electronics Command (NBS technical note ; 1219)

Electrical performance tests for audio distortion analyzers / O.B. Laug, G.N. Stenbakken, and T.F. Leedy ; prepared for U.S. Army Communications Electronics Command (NBS technical note ; 1219)
Microform図書
1986<YCA-C 13.46:1219>
National Diet Library
  • Author Heading...kken, Gerard N Leedy, T. F United States. National Burea...

Large scale integration digital testing : annotated bibliography, 1969-1978 / Thomas F. Leedy ; Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards. (NBS technical note ; 1102)

Large scale integration digital testing : annotated bibliography, 1969-1978 / Thomas F. Leedy ; Electron Devices Division, Center for Electronics and Electrical Engineering, National Engineering Laboratory, National Bureau of Standards. (NBS technical note ; 1102)
Paper図書
U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.1979.<ND1-22>
National Diet Library
  • Author HeadingLeedy, T. F. Center for Electronics and E...

Microelectronic processing laboratory at NBS no.400:53

Microelectronic processing laboratory at NBS no.400:53
Digital図書
T.F. Leedy, Y.M. LiuU.S. G.P.O.1978
Other Libraries in Japan
  • Author HeadingLeedy, T. F. Liu, Y. M.

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