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Effects of irradiation and proton implantation on the density of mobile protons in SiO(sub 2) films SAND980914C DE98 004955 CONF980705

Effects of irradiation and proton implantation on the density of mobile protons in SiO(sub 2) films SAND980914C DE98 004955 CONF980705
Microform規格・テクニカルリポート類
Vanheusden, K, Fleetwood, D. M, Schwank, J. R, Shaneyfelt, M. R, Meisenheimer, T. L1998<LS-DE98/004955>
National Diet Library

ROLE OF BURN-IN DURING QUALIFICATION TESTING (SAND ; SAND-94-0448C)

ROLE OF BURN-IN DURING QUALIFICATION TESTING (SAND ; SAND-94-0448C)
Paper図書
SHANEYFELT, M.R.// FLEETWOOD, D.M.// SCHWANK, J.R.// MEISENHEIMER, T.L.// WINOKUR, P.S. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan
  • Author HeadingSHANEYFELT, M.R. FLEETWOOD, D.M. SCHWANK, J.R. MEISENHEIMER, T.L. WINOKUR, P.S.

TEMPERATURE DEPENDENCE OF STATIC RAM VOLATILITY (SAND ; SAND-93-1926C)

TEMPERATURE DEPENDENCE OF STATIC RAM VOLATILITY (SAND ; SAND-93-1926C)
Paper図書
MEISENHEIMER, T.L.// FLEETWOOD, D.M.// WINOKUR, P.S. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan
  • Author HeadingMEISENHEIMER, T.L. FLEETWOOD, D.M. WINOKUR, P.S.

HARDNESS VARIABILITY IN COMMERCIAL AND HARDENED TECHNOLOGIES (SAND ; SAND-94-0532C)

HARDNESS VARIABILITY IN COMMERCIAL AND HARDENED TECHNOLOGIES (SAND ; SAND-94-0532C)
Paper図書
SHANEYFELT, M.R.// WINOKUR, P.S.// MEISENHEIMER, T.L.// SEXTON, F.W.// ROESKE, S.B.// KNOLL, M.G. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan
  • Author HeadingSHANEYFELT, M.R. WINOKUR, P.S. MEISENHEIMER, T.L. SEXTON, F.W. ROESKE, S.B. KNO...

1/F NOISE AND OXIDE TRAPS IN MOSFETS (SAND ; SAND-93-0037C)

1/F NOISE AND OXIDE TRAPS IN MOSFETS (SAND ; SAND-93-0037C)
Paper図書
FLEETWOOD, D.M.// MEISENHEIMER, T.L.// SCOFIELD, J.H. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan
  • Author HeadingFLEETWOOD, D.M. MEISENHEIMER, T.L. SCOFIELD, J.H.

ADVANCED QUALIFICATION TECHNIQUES (SAND ; SAND-93-1323C)

ADVANCED QUALIFICATION TECHNIQUES (SAND ; SAND-93-1323C)
Paper図書
WINOKUR, P.S.// SHANEYFELT, M.R.// MEISENHEIMER, T.L.// FLEETWOOD, D.M. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan
  • Author HeadingWINOKUR, P.S. SHANEYFELT, M.R. MEISENHEIMER, T.L. FLEETWOOD, D.M.

HARDNESS ASSURANCE FOR LOW-DOSE SPACE APPLICATIONS (SAND ; SAND-91-0482C)

HARDNESS ASSURANCE FOR LOW-DOSE SPACE APPLICATIONS (SAND ; SAND-91-0482C)
Paper図書
FLEETWOOD, D.M.// WINOKUR, P.S.// MEISENHEIMER, T.L. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (USA))Sandia National Laboratories(Sandia National Laboratories)1991.
Other Libraries in Japan
  • Author HeadingFLEETWOOD, D.M. WINOKUR, P.S. MEISENHEIMER, T.L.

1/F NOISE IN N- AND P-CHANNEL MOS DEVICES THROUGH IRRADIATION AND ANNEALING (SAND ; SAND-91-0447C)

1/F NOISE IN N- AND P-CHANNEL MOS DEVICES THROUGH IRRADIATION AND ANNEALING (SAND ; SAND-91-0447C)
Paper図書
MEISENHEIMER, T.L.// FLEETWOOD, D.M.// SHANEYFELT,M.R. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (USA))Sandia National Laboratories(Sandia National Laboratories)1991.
Other Libraries in Japan
  • Author HeadingMEISENHEIMER, T.L. FLEETWOOD, D.M. SHANEYFELT,M....

Effect of radiation-induced charge on 1/f noise in MOS devices (SAND ; SAND-90-2294C) (CONF ; CONF-901235-1)

Effect of radiation-induced charge on 1/f noise in MOS devices (SAND ; SAND-90-2294C) (CONF ; CONF-901235-1)
Paper図書
T.L. Meisenheimer, D.M. Fleetwood1990
Other Libraries in Japan
  • Author HeadingMeisenheimer, T.L. Fleetwood, D.M.

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