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3-dimensional VLSI : a 2.5-dimensional integration scheme : Tsinghua : Springer

3-dimensional VLSI : a 2.5-dimensional integration scheme : Tsinghua : Springer
Paper図書
Yangdong Deng, Wojciech P. MalyTsinghua University Pressc2010
Other Libraries in Japan
  • Author HeadingDeng, Yangdong Maly, W.

図説超LSI工学

図説超LSI工学
PaperDigital図書
W.マリ 著, 小田俊理 訳啓学出版1990.12<ND386-E122>
National Diet LibraryOther Libraries in Japan
  • Author HeadingMaly, W 小田, 俊理, 1951-

From contamination to defects, faults, and yield loss : simulation and applications

From contamination to defects, faults, and yield loss : simulation and applications
Paper図書
by Jitendra B. Khare, Wojciech MalyKluwer Academic Publishersc1996
Other Libraries in Japan
  • Author HeadingKhare, Jitendra B. Maly, W.

Statistical approach to VLSI

Statistical approach to VLSI
Paper図書
[edited by] S.W. Director, W. MalyNorth-Holland1994
Other Libraries in Japan
  • Author HeadingDirector, Stephen W. Maly, W.

VLSI design for manufacturing : yield enhancement

VLSI design for manufacturing : yield enhancement
Paper図書
by Stephen W. Director, Wojciech Maly, Andrzej J. StrojwasKluwer Academic Publishersc1990
Other Libraries in Japan
  • Author HeadingMaly, W. Strojwas, Andrzej J. Directo...

Proceedings : 1991 International Workshop on Defect and Fault Tolerance on VLSI Systems, Hidden Valley, Pa., November 18-20, 1991 : microfiche : case

Proceedings : 1991 International Workshop on Defect and Fault Tolerance on VLSI Systems, Hidden Valley, Pa., November 18-20, 1991 : microfiche : case
Paper図書
edited by Wojciech Maly and Duncan M. Walker ; sponsored by IEEE Computer Society and Technical Committee on Fault-Tolerant Computing ; in cooperation with IEEE Solid-State Circuits Council and Technical Committee on VLSIIEEE Computer Society Pressc1991
Other Libraries in Japan
  • Author Heading...n VLSI Systems Maly, W. Walker, Duncan M. IEEE Compu...

Atlas of IC technologies : an introduction to VLSI processes

Atlas of IC technologies : an introduction to VLSI processes
Paper図書
W. MalyBenjamin/Cummingsc1987
Other Libraries in Japan
  • Author HeadingMaly, W.

Yield modelling and defect tolerance in VLSI : papers presented at the International Workshop on Designing for Yield, Oxford, 1-3 July 1987

Yield modelling and defect tolerance in VLSI : papers presented at the International Workshop on Designing for Yield, Oxford, 1-3 July 1987
Paper図書
edited by Will Moore, Wojciech Maly, and Andrzej StrojwasA. Hilgerc1988
Other Libraries in Japan
  • Author HeadingMoore, Will Maly, W. Strojwas, Andrzej J.

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