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CASE HISTORY: FAILURE ANALYSIS OF A 16K ROM WITH A POLYSILICON GATE DEFECT (SAND ; SAND-93-0385C)

CASE HISTORY: FAILURE ANALYSIS OF A 16K ROM WITH A POLYSILICON GATE DEFECT (SAND ; SAND-93-0385C)
Paper図書
MIKAWA, R.E.// CAMPBELL, A.N. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan
  • Author HeadingMIKAWA, R.E. CAMPBELL, A.N.

Factors contributing to static RAM cell transient upset (Sandia report ; SAND-86-0341C; CONF-860706-9; DE86007710)

Factors contributing to static RAM cell transient upset (Sandia report ; SAND-86-0341C; CONF-860706-9; DE86007710)
Paper図書
Ackermann, M.R., Mikawa, R.E.Sandia National Labs.1986.01.
Other Libraries in Japan
  • Author HeadingAckermann, M.R. Mikawa, R.E.

Factors contributing to CMOS static RAM upset (Sandia report ; SAND-86-1650C; CONF-860706-15; DE86013309)

Factors contributing to CMOS static RAM upset (Sandia report ; SAND-86-1650C; CONF-860706-15; DE86013309)
Paper図書
Ackermann, M.R., Mikawa, R.E.Sandia National Labs.1986.01.
Other Libraries in Japan
  • Author HeadingAckermann, M.R. Mikawa, R.E.

Rail span analysis applied to a gate array (Sandia report ; SAND-86-0340C; CONF-860706-10; DE86007709)

Rail span analysis applied to a gate array (Sandia report ; SAND-86-0340C; CONF-860706-10; DE86007709)
Paper図書
Ackermann, M.R., Mikawa, R.E., Pierce, D.G. [et al.]Sandia National Labs.1986.01.
Other Libraries in Japan
  • Author HeadingAckermann, M.R. Mikawa, R.E. Pierce, D.G. Gover, J.E.

COMPARISON OF IONIZING RADIATION AND HOT ELECTRON EFFECTS IN MOS STRUCTURES. (SAND ; SAND-84-1187C)

COMPARISON OF IONIZING RADIATION AND HOT ELECTRON EFFECTS IN MOS STRUCTURES. (SAND ; SAND-84-1187C)
Paper図書
MIKAWA, R.E.(et al.)Sandia National Laboratories(Sandia National Laboratories)1984.
Other Libraries in Japan
  • Author HeadingMIKAWA, R.E.

Electron spin resonance study of interface states induced by electron injection in metal-oxide-semiconductor devices (SAND ; SAND-85-0346C)

Electron spin resonance study of interface states induced by electron injection in metal-oxide-semiconductor devices (SAND ; SAND-85-0346C)
Paper図書
R.E. Mikawa, P.M. Lenahan1986
Other Libraries in Japan
  • Author HeadingMikawa, R.E. Lenahan, P.M.

COMPARISON OF IONIZING RADIATION AND HOT ELECTRON EFFECTS IN MOS STRUCTURES (CONF ; CONF-840712-12)

COMPARISON OF IONIZING RADIATION AND HOT ELECTRON EFFECTS IN MOS STRUCTURES (CONF ; CONF-840712-12)
Paper図書
1984.
Other Libraries in Japan

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