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Examination procedure outlines for commercial weighing and measuring devices [microform] : a manual for weights and measures officials / editor, G. Diane Lee 2002 ed (NIST handbook ; 112)

Examination procedure outlines for commercial weighing and measuring devices [microform] : a manual for weights and measures officials / editor, G. Diane Lee 2002 ed (NIST handbook ; 112)
Microform図書
2002<YCA-C 13.11:112>
National Diet Library
  • Author HeadingNational Institute of Standards and Technology (U.S.) . Office of Weights and Measures Lee, G. Diane

NIST indices of NTEP device evaluations [microform] / National Type Evaluation Program (NISTIR ; 6304)

NIST indices of NTEP device evaluations [microform] / National Type Evaluation Program (NISTIR ; 6304)
Microform図書
1999<YCA-C 13.58:6304>
National Diet Library
  • Author Heading...Program (U.S.) National Institute of Standards and Technology (U.S.) . Office of Weights and Measures

Specifications and tolerances for reference standards and field standards, weights, and measures : specifications and tolerances for field standard weights (NIST class F) Rev. 1990 (NIST handbook ; 105-1)

Specifications and tolerances for reference standards and field standards, weights, and measures : specifications and tolerances for field standard weights (NIST class F) Rev. 1990 (NIST handbook ; 105-1)
Microform図書
1990<YCA-C 13.11:105-1/2/990>
National Diet Library
  • Author HeadingNational Institute of Standards and Technology (U.S.) . Office of Weights and Measures

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