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High performance Schottky UV detectors (265-100 nm) using n-Al0.5Ga0.5N on AlN epitaxial layer

High performance Schottky UV detectors (265-100 nm) using n-Al0.5Ga0.5N on AlN epitaxial layer
Digital文書・図像類
MIYAKE, H, YASUKAWA, H, KIDA, Y, OHTA, K, SHIBATA, Y, MOTOGAITO, A, HIRAMATSU, K, OHUCHI, Y, TADATOMO, K, HAMAMURA, Y, FUKUI, KJohn Wiley & Sons2003Physica Status Solidi - A - Applications and Materials Science200 1p.151-154
Other Libraries in Japan
  • Author Heading...A HIRAMATSU, K OHUCHI, Y TADATOMO, K HAMAMURA, Y FUKUI...

Characterization of GaN Based UV-VUV Detectors in the Range 3.4-25 eV by Using Synchrotron Radiation

Characterization of GaN Based UV-VUV Detectors in the Range 3.4-25 eV by Using Synchrotron Radiation
Digital文書・図像類
MOTOGAITO, A, OHTA, K, HIRAMATSU, K, OHUCHI, Y, TADATOMO, K, HAMAMURA, Y, FUKUI, KJohn Wiley & Sons2001-08Physica Status Solidi - A - Applications and Materials Science188 1p.337-340
Other Libraries in Japan
  • Author HeadingMOTOGAITO, A OHTA, K HIRAMATSU, K OHUCHI, Y TADATOMO, K HAMAMURA, Y FUKUI...

2002 Japan-USA symposium on flexible automation : international conference on new technological innovation for the 21st century : July 14-19,2002 Hiroshima,Japan : proceedings v.2

2002 Japan-USA symposium on flexible automation : international conference on new technological innovation for the 21st century : July 14-19,2002 Hiroshima,Japan : proceedings v.2
Paper図書
edited by M.Mitsuishi, T.R.Kurfess[Institute of Systems, Control and Information Engineers]2002<M18-B119>
National Diet Library

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