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Optical micro- and nanometrology V : 15-17 April 2014 : Brussels, Belgium : 6th conference on optical micro- and nanometrology, photonics Europe : Apr 2014, Brussels, Belgium. (SPIE Proceedings ; 9132)

Optical micro- and nanometrology V : 15-17 April 2014 : Brussels, Belgium : 6th conference on optical micro- and nanometrology, photonics Europe : Apr 2014, Brussels, Belgium. (SPIE Proceedings ; 9132)
Paper図書
SPIE[2014]<M17-15-864>
National Diet Library
  • Author HeadingGorecki, Christophe. Asundi, Anand Krishna. Osten, Wolfgang. Comite belge d'optique.

Optical measurement systems for industrial inspection 8 : 13-16 May 2013 : Munich, Germany : conference on "optical measurement systems for industrial inspection" : May 2013, Munich, Germany. (SPIE Proceedings ; 8788)

Optical measurement systems for industrial inspection 8 : 13-16 May 2013 : Munich, Germany : conference on "optical measurement systems for industrial inspection" : May 2013, Munich, Germany. (SPIE Proceedings ; 8788)
Paper図書
SPIEc2013.<M17-14-101>
National Diet Library
  • Author HeadingLehmann, Peter H. Osten, Wolfgang. Albertazzi, Armando. European...

Optical micro- and nanometrology 4 : 16-18 April 2012 : Brussels, Belgium : Apr 2012, Brussels, Belgium. (SPIE Proceedings ; 8430)

Optical micro- and nanometrology 4 : 16-18 April 2012 : Brussels, Belgium : Apr 2012, Brussels, Belgium. (SPIE Proceedings ; 8430)
Paper図書
SPIEc2012.<M17-12-3990>
National Diet Library
  • Author HeadingGorecki, Christophe. Asundi, Anand. Osten, Wolfgang. Comite belge d'optique.

Optical measurement systems for industrial inspection 7 : 23-26 May 2011 : Munich, Germany : conference on optical measurement systems for industrial inspection : May 2011, Munich, Germany. (SPIE Proceedings ; 8082)

Optical measurement systems for industrial inspection 7 : 23-26 May 2011 : Munich, Germany : conference on optical measurement systems for industrial inspection : May 2011, Munich, Germany. (SPIE Proceedings ; 8082)
Paper図書
SPIEc2011.<M17-12-1048>
National Diet Library
  • Author HeadingLehmann, Peter H. Osten, Wolfgang. Gastinger, Kay. Norwegian Uni...

Optical micro- and nanometrology 3 : 13-16 April 2010 : Brussels, Belgium. : Apr 2010, Brussels, Belgium. (SPIE Proceedings ; 7718)

Optical micro- and nanometrology 3 : 13-16 April 2010 : Brussels, Belgium. : Apr 2010, Brussels, Belgium. (SPIE Proceedings ; 7718)
Paper図書
SPIEc2010.<M17-10-3986>
National Diet Library
  • Author HeadingComite belge d'optique. Gorecki, Christophe. Asundi, Anand. Osten, Wolfgang.

Holography and speckle : a review of 60 successful years

Holography and speckle : a review of 60 successful years
Paper図書
Wolfgang Osten, Yuhong Bai, editorsSpringerc2023
Other Libraries in Japan

Interferometry 14: applications : 13-14 August 2008 : San Diego, California, USA. : Aug 2008, San Diego, CA. (SPIE Proceedings ; 7064)

Interferometry 14: applications : 13-14 August 2008 : San Diego, California, USA. : Aug 2008, San Diego, CA. (SPIE Proceedings ; 7064)
Paper図書
SPIEc2008.<M17-09-191>
National Diet LibraryOther Libraries in Japan
  • Author HeadingNovak, Erik L. (Erik Lowell) , 1971- Osten, Wolfgang. Gorecki, Christophe.

Optical micro- and nanometrology in microsystems technology 2 : 8-10 April 2008 : Strasbourg, France. : Apr 2008, Strasbourg, France. (SPIE Proceedings ; 6995)

Optical micro- and nanometrology in microsystems technology 2 : 8-10 April 2008 : Strasbourg, France. : Apr 2008, Strasbourg, France. (SPIE Proceedings ; 6995)
Paper図書
SPIEc2008.<M17-08-1739>
National Diet LibraryOther Libraries in Japan
  • Author Heading...Asundi, Anand. Osten, Wolfgang.

Optical measurement systems for industrial inspection 5 : 18-22 June 2007 : Munich, Germany. : Munich conference : Jun 2007, Munich, Germany. (SPIE Proceedings ; 6616)

Optical measurement systems for industrial inspection 5 : 18-22 June 2007 : Munich, Germany. : Munich conference : Jun 2007, Munich, Germany. (SPIE Proceedings ; 6616)
Paper図書
SPIEc2007.<M17-07-2606>
National Diet Library
  • Author Heading... Society (EOS) Osten, Wolfgang. Gorecki, Christophe. Novak, E...

Interferometry 13: applications : 16-17 August 2006 : San Diego, California, USA. : Aug 2006, San Diego, CA. (SPIE Proceedings ; 6293)

Interferometry 13: applications : 16-17 August 2006 : San Diego, California, USA. : Aug 2006, San Diego, CA. (SPIE Proceedings ; 6293)
Paper図書
SPIEc2006.<M17-06-2592>
National Diet LibraryOther Libraries in Japan
  • Author HeadingNovak, Erik L. (Erik Lowell) , 1971- Osten, Wolfgang. Gorecki, Christophe.

Optical micro- and nanometrology in microsystems technology : 5-7 April 2006 : Strasbourg, France. : photonics Europe : Apr 2006, Strasbourg, France. (SPIE Proceedings ; 6188)

Optical micro- and nanometrology in microsystems technology : 5-7 April 2006 : Strasbourg, France. : photonics Europe : Apr 2006, Strasbourg, France. (SPIE Proceedings ; 6188)
Paper図書
SPIEc2006.<M17-06-2095>
National Diet LibraryOther Libraries in Japan
  • Author Heading...Asundi, Anand. Osten, Wolfgang.

Interferometry 12: applications : 4-5 August 2004 : Denver, Colorado, USA. : Aug 2004, Denver, CO. (SPIE Proceedings ; 5532)

Interferometry 12: applications : 4-5 August 2004 : Denver, Colorado, USA. : Aug 2004, Denver, CO. (SPIE Proceedings ; 5532)
Paper図書
SPIEc2004.<M17-04-3636>
National Diet LibraryOther Libraries in Japan
  • Author HeadingOsten, Wolfgang. Novak, Erich, 1953-

Optical metrology in production engineering : 27-30 April 2004 : Strasbourg, France. : photonics Europe : Apr 2004, Strasbourg, France. (SPIE Proceedings ; 5457)

Optical metrology in production engineering : 27-30 April 2004 : Strasbourg, France. : photonics Europe : Apr 2004, Strasbourg, France. (SPIE Proceedings ; 5457)
Paper図書
SPIEc2004.<M17-04-3509>
National Diet LibraryOther Libraries in Japan
  • Author HeadingEuropean Optical Society (EOS) Osten, Wolfgang. Takeda, Mitsuo, 1946-

Optical measurement systems for industrial inspection 3 : 23-26 June 2003 : Munich, Germany. : Jun 2003, Munich, Germany. (SPIE Proceedings ; 5144)

Optical measurement systems for industrial inspection 3 : 23-26 June 2003 : Munich, Germany. : Jun 2003, Munich, Germany. (SPIE Proceedings ; 5144)
Paper図書
SPIEc2003.<M17-04-64>
National Diet LibraryOther Libraries in Japan
  • Author HeadingOsten, Wolfgang. Creath, Katherine. Kujawińska...

Interferometry 11: applications : 10-11 July 2002 : Seattle USA. : Jul 2002, Seattle, WA. (SPIE Proceedings ; 4778)

Interferometry 11: applications : 10-11 July 2002 : Seattle USA. : Jul 2002, Seattle, WA. (SPIE Proceedings ; 4778)
Paper図書
SPIEc2002.<M17-03-4247>
National Diet LibraryOther Libraries in Japan
  • Author HeadingBoeing Company. Osten, Wolfgang.

Advanced photonic sensors and applications 2 : 27-30 November 2001 : Singapore. : Nov 2001, Singapore. (SPIE Proceedings ; 4596)

Advanced photonic sensors and applications 2 : 27-30 November 2001 : Singapore. : Nov 2001, Singapore. (SPIE Proceedings ; 4596)
Paper図書
SPIEc2001.<M17-03-3048>
National Diet Library
  • Author HeadingAsundi, Anand. Osten, Wolfgang. Varadan, V. K., 1943-

Optical measurement systems for industrial inspection 2: application in industrial design : 18-19 June 2001 : Munich, Germany. : Jun 2001, Munich, Germany. (SPIE Proceedings ; 4398)

Optical measurement systems for industrial inspection 2: application in industrial design : 18-19 June 2001 : Munich, Germany. : Jun 2001, Munich, Germany. (SPIE Proceedings ; 4398)
Paper図書
SPIEc2001.<M17-03-4978>
National Diet Library
  • Author HeadingOsten, Wolfgang. Jüptner, Werner P. O. Kujawiń...

Fringe 2013 : 7th international workshop on advanced optical imaging and metrology

Fringe 2013 : 7th international workshop on advanced optical imaging and metrology
Paper図書
Wolfgang Osten editorSpringerc2014
Other Libraries in Japan

Optical inspection of microsystems

Optical inspection of microsystems
Paper図書
edited by Wolfgang OstenCRC/Taylor & Francisc2007
Other Libraries in Japan

Optical measurement systems for industrial inspection V : 18-22 June 2007, Munich, Germany

Optical measurement systems for industrial inspection V : 18-22 June 2007, Munich, Germany
Paper図書
Wolfgang Osten, Christophe Gorecki, Erik L. Novak, editors ; sponsored by SPIE Europe ; cooperating organizations, EOS--European Optical Society, WLT--Wissenschaftliche Gesellschaft Lasertechnik e.V. (Germany)SPIEc2007
Other Libraries in Japan
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