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Electrical biasing and voltage contrast imaging in a focused ion beam system SAND-95-1937C DE95 017566 CONF-9511563

Electrical biasing and voltage contrast imaging in a focused ion beam system SAND-95-1937C DE95 017566 CONF-9511563
Microform規格・テクニカルリポート類
Campbell, A. N, Soden, J. M, Rife, J. L, Lee, R. G1995<LS-DE95/017566>
National Diet Library

ELECTRICAL BIASING AND VOLTAGE CONTRAST IMAGING IN A FOCUSED ION BEAM SYSTEM (SAND ; SAND-95-1937C)

ELECTRICAL BIASING AND VOLTAGE CONTRAST IMAGING IN A FOCUSED ION BEAM SYSTEM (SAND ; SAND-95-1937C)
Paper図書
CAMPBELL, A.N.// SODEN, J.M.// RIFE, J.L.// LEE, R.G. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1995.
Other Libraries in Japan
  • Author HeadingCAMPBELL, A.N. SODEN, J.M. RIFE, J.L. LEE, R.G.

NOVEL FAILURE ANALYSIS TECHNIQUES USING PHOTON PROBING WITH A SCANNING OPTICAL MICROSCOPE (SAND ; SAND-93-2429C)

NOVEL FAILURE ANALYSIS TECHNIQUES USING PHOTON PROBING WITH A SCANNING OPTICAL MICROSCOPE (SAND ; SAND-93-2429C)
Paper図書
COLE, E.I. JR.// SODEN, J.M.// RIFE, J.L.// BARTON, D.L.// HENDERSON, C.L. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1993.
Other Libraries in Japan
  • Author HeadingCOLE, E.I. JR. SODEN, J.M. RIFE, J.L. BARTON, D.L. HENDERSON, C.L.

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