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Transient annealing in semiconductor devices following pulsed neutron irradiation (SC ; SC-DC-66-1820; CONF-660705-1)

Transient annealing in semiconductor devices following pulsed neutron irradiation (SC ; SC-DC-66-1820; CONF-660705-1)
Paper図書
Sander, H.H., Gregory, B.L.Sandia Corp.1966.7.
Other Libraries in Japan
  • Author HeadingSander, H.H. Gregory, B.L.

ROOM TEMPERATURE ANNEALING OF SILICON TRANSISTOR PARAMETERS DEGRADED BY A BURST OF NEUTRONS. (SC ; SC-R-64-192; CONF-617-4)

ROOM TEMPERATURE ANNEALING OF SILICON TRANSISTOR PARAMETERS DEGRADED BY A BURST OF NEUTRONS. (SC ; SC-R-64-192; CONF-617-4)
Paper図書
SANDER, H.H.1964.
Other Libraries in Japan
  • Author HeadingSANDER, H.H.

DEVICE FOR THE MEASUREMENT OF LIBERATED ENERGY IN EXPLOSION. (ORNL ; ORNL-TR-588)

DEVICE FOR THE MEASUREMENT OF LIBERATED ENERGY IN EXPLOSION. (ORNL ; ORNL-TR-588)
Paper図書
SANDER, H.H.(et al.)Oak Ridge National Laboratory(Oak Ridge National Laboratory)1963.
Other Libraries in Japan
  • Author HeadingSANDER, H.H.

BEHAVIOR OF TRANSISTORS IN A MAGNETIC FIELD (AECU ; AECU-3223)

BEHAVIOR OF TRANSISTORS IN A MAGNETIC FIELD (AECU ; AECU-3223)
Paper図書
1954.
Other Libraries in Japan

UNIFIED MODEL OF DAMAGE ANNEALING IN CMOS, FROM FREEZE-IN TO TRANSIENT ANNEALING. (SAND ; SAND-75-5288)

UNIFIED MODEL OF DAMAGE ANNEALING IN CMOS, FROM FREEZE-IN TO TRANSIENT ANNEALING. (SAND ; SAND-75-5288)
Paper図書
SANDER, H.H.(et al.)Sandia National Laboratories(Sandia National Laboratories)
Other Libraries in Japan
  • Author HeadingSANDER, H.H.

TRANSIENT ANNEALING IN SEMICONDUCTOR DEVICES FOLLOWING PULSED NEUTRON IRRADIATION. (SC ; SC-R-66-923)

TRANSIENT ANNEALING IN SEMICONDUCTOR DEVICES FOLLOWING PULSED NEUTRON IRRADIATION. (SC ; SC-R-66-923)
Paper図書
SANDER, H.H.
Other Libraries in Japan
  • Author HeadingSANDER, H.H.

THE RECTIVERTER. (SCTM ; SCTM-81-59(51))

THE RECTIVERTER. (SCTM ; SCTM-81-59(51))
Paper図書
SANDER,H.H.
Other Libraries in Japan

CIRCUIT APPLICATIONS OF TRANSIENT ANNEALING. (SC ; SC-DC-713804)

CIRCUIT APPLICATIONS OF TRANSIENT ANNEALING. (SC ; SC-DC-713804)
Paper図書
SANDER, H.H.
Other Libraries in Japan
  • Author HeadingSANDER, H.H.

IMPURITY EFFECTS ON TRANSISTOR CURRENT GAIN AND RADIATION TOLERANCE AT LOW TEMPERATURES. (SC ; SC-DC-69-1678)

IMPURITY EFFECTS ON TRANSISTOR CURRENT GAIN AND RADIATION TOLERANCE AT LOW TEMPERATURES. (SC ; SC-DC-69-1678)
Paper図書
SANDER, H.H.
Other Libraries in Japan
  • Author HeadingSANDER, H.H.

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