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Transient annealing in semiconductor devices following pulsed neutron irradiation (SC ; SC-DC-66-1820; CONF-660705-1)
Transient annealing in semiconductor devices following pulsed neutron irradiation (SC ; SC-DC-66-1820; CONF-660705-1)
Paper
図書
Sander, H.H., Gregory, B.L.
Sandia Corp.
1966.7.
Other Libraries in Japan
ROOM TEMPERATURE ANNEALING OF SILICON TRANSISTOR PARAMETERS DEGRADED BY A BURST OF NEUTRONS. (SC ; SC-R-64-192; CONF-617-4)
ROOM TEMPERATURE ANNEALING OF SILICON TRANSISTOR PARAMETERS DEGRADED BY A BURST OF NEUTRONS. (SC ; SC-R-64-192; CONF-617-4)
Paper
図書
SANDER, H.H.
1964.
Other Libraries in Japan
DEVICE FOR THE MEASUREMENT OF LIBERATED ENERGY IN EXPLOSION. (ORNL ; ORNL-TR-588)
DEVICE FOR THE MEASUREMENT OF LIBERATED ENERGY IN EXPLOSION. (ORNL ; ORNL-TR-588)
Paper
図書
SANDER, H.H.(et al.)
Oak Ridge National Laboratory(Oak Ridge National Laboratory)
1963.
Other Libraries in Japan
BEHAVIOR OF TRANSISTORS IN A MAGNETIC FIELD (AECU ; AECU-3223)
BEHAVIOR OF TRANSISTORS IN A MAGNETIC FIELD (AECU ; AECU-3223)
Paper
図書
1954.
Other Libraries in Japan
UNIFIED MODEL OF DAMAGE ANNEALING IN CMOS, FROM FREEZE-IN TO TRANSIENT ANNEALING. (SAND ; SAND-75-5288)
UNIFIED MODEL OF DAMAGE ANNEALING IN CMOS, FROM FREEZE-IN TO TRANSIENT ANNEALING. (SAND ; SAND-75-5288)
Paper
図書
SANDER, H.H.(et al.)
Sandia National Laboratories(Sandia National Laboratories)
Other Libraries in Japan
TRANSIENT ANNEALING IN SEMICONDUCTOR DEVICES FOLLOWING PULSED NEUTRON IRRADIATION. (SC ; SC-R-66-923)
TRANSIENT ANNEALING IN SEMICONDUCTOR DEVICES FOLLOWING PULSED NEUTRON IRRADIATION. (SC ; SC-R-66-923)
Paper
図書
SANDER, H.H.
Other Libraries in Japan
THE RECTIVERTER. (SCTM ; SCTM-81-59(51))
THE RECTIVERTER. (SCTM ; SCTM-81-59(51))
Paper
図書
SANDER,H.H.
Other Libraries in Japan
Author Heading
SANDER,H.H.
CIRCUIT APPLICATIONS OF TRANSIENT ANNEALING. (SC ; SC-DC-713804)
CIRCUIT APPLICATIONS OF TRANSIENT ANNEALING. (SC ; SC-DC-713804)
Paper
図書
SANDER, H.H.
Other Libraries in Japan
IMPURITY EFFECTS ON TRANSISTOR CURRENT GAIN AND RADIATION TOLERANCE AT LOW TEMPERATURES. (SC ; SC-DC-69-1678)
IMPURITY EFFECTS ON TRANSISTOR CURRENT GAIN AND RADIATION TOLERANCE AT LOW TEMPERATURES. (SC ; SC-DC-69-1678)
Paper
図書
SANDER, H.H.
Other Libraries in Japan
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