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Optical fabrication and testing : International conference : Jun 1995, Tokyo, Japan. (SPIE Proceedings ; 2576)

Optical fabrication and testing : International conference : Jun 1995, Tokyo, Japan. (SPIE Proceedings ; 2576)
Paper図書
SPIE1995.<M17-95-2085>
National Diet Library
  • Author Heading...l Engineering. SPIE-The International Society for Optical Engineering. Japan Chapter.

Applications of optical holography : International conference : Jun 1995, Tokyo, Japan. (SPIE Proceedings ; 2577)

Applications of optical holography : International conference : Jun 1995, Tokyo, Japan. (SPIE Proceedings ; 2577)
Paper図書
SPIE1995.<M17-95-2086>
National Diet Library
  • Author Heading...l Engineering. SPIE-The International Society for Optical Engineering. Japan Chapter.

Optical fabrication, testing and surface evaluation : International symposium : Jun 1992, Tokyo, Japan. (SPIE Proceedings ; 1720)

Optical fabrication, testing and surface evaluation : International symposium : Jun 1992, Tokyo, Japan. (SPIE Proceedings ; 1720)
Paper図書
SPIE1992.<M17-93-1086>
National Diet Library
  • Author HeadingSPIE-The International Society for Optical Engineering. Japan Chapter.

Photomask and X-ray mask technology : International photomask Japan symposium : Apr 1994, Kawasaki, Japan. (SPIE Proceedings ; 2254)

Photomask and X-ray mask technology : International photomask Japan symposium : Apr 1994, Kawasaki, Japan. (SPIE Proceedings ; 2254)
Paper図書
SPIE1994.<M17-95-0869>
National Diet Library
  • Author HeadingSPIE-The International Society for Optical Engineering. Japan Chapter. SPIE-The International Societ...

Color reproduction : Neugebauer memorial seminar : Dec 1989, Tokyo, Japan. (SPIE Proceedings ; 1184)

Color reproduction : Neugebauer memorial seminar : Dec 1989, Tokyo, Japan. (SPIE Proceedings ; 1184)
Paper図書
SPIE1990.<M17-90-2434>
National Diet Library
  • Author HeadingSPIE-The International Society for Optical Engineering. Japan Chapter. SPSE-The Society for Imaging ...

Polarization analysis and applications to device technology : International symposium : Jun 1996, Yokohama, Japan. (SPIE Proceedings ; 2873)

Polarization analysis and applications to device technology : International symposium : Jun 1996, Yokohama, Japan. (SPIE Proceedings ; 2873)
Paper図書
<M17-96-2016>
National Diet LibraryOther Libraries in Japan
  • Author HeadingSPIE-The International Society for Optical Engineering. Japan Chapter. Japan Optical Measuring Instr...

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