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Advanced experimental methods for noise research in nanoscale electronic devices. : NATO advanced research workshop on advanced experimental methods for noise research in nanoscale electronic devices : Aug 2003, Brno, Czech Republic. (NATO Science Series. Series II, Mathematics, Physics, and Chemistry ; 151)

Advanced experimental methods for noise research in nanoscale electronic devices. : NATO advanced research workshop on advanced experimental methods for noise research in nanoscale electronic devices : Aug 2003, Brno, Czech Republic. (NATO Science Series. Series II, Mathematics, Physics, and Chemistry ; 151)
Paper図書
Kluwer Academic Publishersc2004.<M17-04-3303>
National Diet Library
  • Author HeadingSikula, Josef. Levinshteĭn, M. E. (Mikhail ...

3rd European Microelectronics and Packaging Symposium with Table top Exhibition : proceedings, 16th to 18th June 2004, Hotel Diplomat, Prague, Czech Republic

3rd European Microelectronics and Packaging Symposium with Table top Exhibition : proceedings, 16th to 18th June 2004, Hotel Diplomat, Prague, Czech Republic
Paper図書
editor Josef SikulaIMAPS CZ&SK Chapterc2004
Other Libraries in Japan
  • Author HeadingEuropean Microelectronics and Packaging Symposium Sikula, Josef

Noise and fluctuations : proceedings of the 17th internatinal conference, August 18-22 2003, Charles University Conference Cerntre, Prague, Czech Republic

Noise and fluctuations : proceedings of the 17th internatinal conference, August 18-22 2003, Charles University Conference Cerntre, Prague, Czech Republic
Paper図書
editor Josef SikulaCNRL s.r.o.c2003
Other Libraries in Japan
  • Author Heading...zech Republic) Sikula, Josef

Advanced experimental methods for noise research in nanoscale electronic devices : pbk.

Advanced experimental methods for noise research in nanoscale electronic devices : pbk.
Paper図書
edited by Josef Sikula and Michael LevinshteinKluwer Academic Publishersc2004
Other Libraries in Japan
  • Author Heading...tronic Devices Sikula, Josef Levinshtein, Michael

Noise and non-linearity testing of modern electronic components : proceedings of the internatinal workshop : NNT 2001, september 12-13, 2001, Brno, Czech Republic

Noise and non-linearity testing of modern electronic components : proceedings of the internatinal workshop : NNT 2001, september 12-13, 2001, Brno, Czech Republic
Paper図書
editors J. Šikula and P. KoktavýCNRL s.r.o.c2001
Other Libraries in Japan
  • Author Heading...zech Republic) Šikula, Josef Koktavý, P.

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