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Characterization of organic thin films
Characterization of organic thin films
Paper
図書
[Abraham Ulman] ; editors, Yale Strausser and Gray E. McGuire
Momentum Press
c2010
Other Libraries in Japan
Author Heading
Ulman, Abraham
Strausser, Yale
McGuire, Gray E.
Characterization in compound semiconductor processing
Characterization in compound semiconductor processing
Paper
図書
editors, Yale Strausser and Gary E. McGuire ; consulting editor, C.R. Brundle ; managing editor, Lee E. Fitzpatrick
Butterworth-Heinemann
c1995
Other Libraries in Japan
Author Heading
Strausser, Yale
McGuire, G. E.
Characterization in silicon processing
Characterization in silicon processing
Paper
図書
editor, Yale Strusser ; consulting editors, C.R. Brundle, Gary E. McGuire ; managing editor, Lee E. Fitzpatrick
Butterworth-Heinemann
c1993
Other Libraries in Japan
Author Heading
Strausser, Yale
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