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Electronic design automation : synthesis, verification, and test

Electronic design automation : synthesis, verification, and test
Paper図書
edited by Laung-Terng Wang, Yao-Wen Chang, Kwang-Ting (Tim) ChengMorgan Kaufmann/Elsevierc2009
Other Libraries in Japan
  • Author HeadingWang, Laung-Terng Chang, Yao-Wen Cheng, Kwang-T...

System-on-chip test architectures : nanometer design for testability

System-on-chip test architectures : nanometer design for testability
Paper図書
edited by Laung-Terng Wang, Charles E. Stroud, Nur A. ToubaMorgan Kaufmann Pub.c2008
Other Libraries in Japan
  • Author HeadingWang, Laung-Terng Stroud, Charles E. Touba, Nur

VLSI test principles and architectures : design for testability

VLSI test principles and architectures : design for testability
Paper図書
edited by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing WenElsevier Morgan Kaufmann Publishers2006
Other Libraries in Japan
  • Author HeadingWang, Laung-Terng Wu, Cheng-Wen, EE Ph. D. Wen,...

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