sponsored by the IEEE Electron Devices Society and the IEEE Reliability GroupElectron Device and Reliability Group of the Institute of Electrical and Electronics Engineers Inc.c1976
sponsored by the IEEE Electron Devices Group and the IEEE Reliability GroupElectron Device and Reliability Group of the Institute of Electrical and Electronics Engineers Inc.c1975
sponsored by the IEEE Electron Devices Group and the IEEE Reliability GroupElectron Device and Reliability Group of the Institute of Electrical and Electronics Engineers Inc.c1974
sponsored by the IEEE Electron Devices Group and the IEEE Reliability GroupElectron Device and Reliability Group of the Institute of Electrical and Electronics Engineers Inc.c1973
sponsored by the IEEE Electron Devices Group and the IEEE Reliability GroupElectron Device and Reliability Groups of the Institute of Electrical and Electronics Engineers Inc.c1972
sponsored by the IEEE Electron Devices Group and the IEEE Reliability GroupElectron Device and Reliability Groups of the Institute of Electrical and Electronics Engineersc1971
[co-sponsored by the Electron Devices and Reliability Groups of the Institute of Electrial and Electronics Engineers, Inc.]Electron Devices and Reliability Groups of the Institute of Electrical and Electronics Engineersc1968]