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INSPEC Matters

INSPEC Matters
Paper雑誌雑誌タイトル
INSPEC, Institution of Electrical Engineers<Z59-D758>
National Diet LibraryOther Libraries in Japan
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Process technology for silicon carbide devices

Process technology for silicon carbide devices
Paper図書
edited by Carl-Mikael ZetterlingINSPECc2002
Other Libraries in Japan

MEMS packaging

MEMS packaging
Paper図書
edited by Tai-Ran HsuINSPEC, Institution of Electrical Engineersc2004
Other Libraries in Japan
  • Author HeadingHsu, Tai-Ran INSPEC (Information service)

Properties of amorphous carbon

Properties of amorphous carbon
Paper図書
edited by S. Ravi P. SilvaINSPEC, Institution of Electrical Engineersc2003
Other Libraries in Japan

Classification 1999 : a classification scheme for the INSPEC database

Classification 1999 : a classification scheme for the INSPEC database
Paper図書
INSPEC1999
Other Libraries in Japan
  • Subject HeadingClassification, INSPEC INSPEC (Information retrieval system...
  • Subject Heading (ID)Classification, INSPEC INSPEC (Information retrieval system...
  • Note (General)Includes index Running title: INSPEC classification 1999

Properties, processing and applications of gallium nitride and related semiconductors

Properties, processing and applications of gallium nitride and related semiconductors
Paper図書
edited by James H. Edgar ... [et al.]INSPECc1999
Other Libraries in Japan

Properties, processing and applications of glass and rare earth-doped glasses for optical fibres

Properties, processing and applications of glass and rare earth-doped glasses for optical fibres
Paper図書
edited by Dan HewakINSPECc1998
Other Libraries in Japan
  • Author HeadingHewak, Dan INSPEC (Information service)

Silicon wafer bonding technology : for VLSI and MEMS applications

Silicon wafer bonding technology : for VLSI and MEMS applications
Paper図書
edited by Subramanian S. Iyer and Andre J. Auberton-HervéINSPEC, The Institution of Electrical Engineersc2002
Other Libraries in Japan

Physical properties of liquid crystals: nematics

Physical properties of liquid crystals: nematics
Paper図書
edited by David Dunmur, Atsuo Fukuda and Geoffrey LuckhurstINSPEC, Institution of Electrical Engineersc2001
Other Libraries in Japan

Properties of lithium niobate

Properties of lithium niobate
Paper図書
edited by K.K. WongINSPEC/Institution of Electrical Engineersc2002
Other Libraries in Japan
  • Author HeadingWong, K. K Institution of Electrical Engineers INSPEC

Properties, growth and applications of diamond

Properties, growth and applications of diamond
Paper図書
edited by M. H. Nazaré and A. J. PortugalINSPEC, Institution of Electrical Engineersc2001
Other Libraries in Japan

Properties of III-V quantum wells and superlattices

Properties of III-V quantum wells and superlattices
Paper図書
edited by Pallab BhattacharyaINSPECc1996
Other Libraries in Japan
  • Author HeadingBhattacharya, Pallab INSPEC

Properties of silicon germanium and SiGe : carbon

Properties of silicon germanium and SiGe : carbon
Paper図書
edited by Erich Kasper and Klara LyutovichINSPEC, Institution of Electrical Engineersc1999
Other Libraries in Japan

Classification : a classification scheme for the INSPEC database 1995 1991

Classification : a classification scheme for the INSPEC database 1995 1991
Paper図書
INSPECc1991-
Other Libraries in Japan
  • Subject HeadingClassification, INSPEC INSPEC (Information retrieval system...
  • Subject Heading (ID)Classification, INSPEC INSPEC (Information retrieval system...
  • Author HeadingINSPEC (Information service)

Properties of metal silicides

Properties of metal silicides
Paper図書
edited by Karen Maex and Marc van RossumINSPECc1995
Other Libraries in Japan
  • Author HeadingMaex, Karen Rossum, Marc van INSPEC (Information service) Institu...

Properties of silicon carbide

Properties of silicon carbide
Paper図書
edited by Gary L. HarrisINSPECc1995
Other Libraries in Japan
  • Author HeadingHarris, Gary Lynn INSPEC (Information service) Institu...

Properties of crystalline silicon

Properties of crystalline silicon
Paper図書
edited by Robert HullINSPEC, Institution of Electrical Engineersc1999
Other Libraries in Japan

Properties of narrow gap cadmium-based compounds

Properties of narrow gap cadmium-based compounds
Paper図書
edited by Peter CapperINSPECc1994
Other Libraries in Japan

Properties of amorphous silicon and its alloys

Properties of amorphous silicon and its alloys
Paper図書
edited by Tim SearleINSPEC, Institution of Electrical Engineersc1998
Other Libraries in Japan
  • Author HeadingSearle, Tim INSPEC (Information service)

Properties of strained and relaxed silicon germanium

Properties of strained and relaxed silicon germanium
Paper図書
edited by Erich KasperINSPEC, IEEc1995
Other Libraries in Japan
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