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Neural models and algorithms for digital testing : acid-free paper

Neural models and algorithms for digital testing : acid-free paper
Paper図書
by Srimat T. Chakradhar, Vishwani D. Agrawal, Michael L. BushnellKluwer Academic Publishersc1991
Other Libraries in Japan
  • Subject Heading...kout equipment Digital integrated circuits -- Testing -- Data processing
  • Subject Heading (ID)...kout equipment Digital integrated circuits -- Testing -- Data processing

High-level test synthesis of digital VLSI circuits

High-level test synthesis of digital VLSI circuits
Paper図書
Mike Tien-Chien LeeArtech Housec1997
Other Libraries in Japan
  • Subject Heading...r-aided design Digital integrated circuits -- Testing -- Data processing
  • Subject Heading (ID)...r-aided design Digital integrated circuits -- Testing -- Data processing

Probabilistische Verfahren für den Test hochintegrierter Schaltungen gw us

Probabilistische Verfahren für den Test hochintegrierter Schaltungen gw us
Paper図書
Hans-Joachim WunderlichSpringer-Verlagc1987
Other Libraries in Japan
  • Subject HeadingDigital integrated circuits -- Testing -- Data processing Probabilities
  • Subject Heading (ID)Digital integrated circuits -- Testing -- Data processing Probabilities

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