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Spreading resistance analysis for silicon layers with nonuniform resistivity

Spreading resistance analysis for silicon layers with nonuniform resistivity
Digital図書
David H. Dickey and James R. EhrsteinU.S. G.P.O.1979
Other Libraries in Japan
  • Subject HeadingSemiconductors -- Testing Electric resistance, Spreading Silicon -- Electric propertie...
  • Subject Heading (ID)Semiconductors -- Testing Electric resistance, Spreading Silicon -- Electric propertie...

Semiconductor measurement technology : spreading resistance symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974 400-10

Semiconductor measurement technology : spreading resistance symposium : proceedings of a symposium, held at the National Bureau of Standards, Gaithersburg, Md., June 13-14, 1974 400-10
Digital図書
James R. Ehrstein, editorU.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.1974
Other Libraries in Japan
  • Subject HeadingSemiconductors -- Testing -- Congresses Electric resistance, Spreading -- Congresses
  • Subject Heading (ID)Semiconductors -- Testing -- Congresses Electric resistance, Spreading -- Congresses

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