Jump to main content

yr 〜
yr

Search results 21

Electromigration in ULSI Interconnections (International series on advances in solid state electronics and technology)

Electromigration in ULSI Interconnections (International series on advances in solid state electronics and technology)
Paper図書
Cher Ming Tan.World Scientificc2010.<ND386-B25>
National Diet LibraryOther Libraries in Japan
  • Subject HeadingIntegrated circuits--Ultra large scale integration. Electrodiffusion.

Electromigration in thin films and electronic devices : materials and reliability (Woodhead Publishing in materials)

Electromigration in thin films and electronic devices : materials and reliability (Woodhead Publishing in materials)
Paper図書
edited by Choong-Un Kim.Woodhead Publishing2011<ND386-B30>
National Diet Library
  • Subject Heading...Deterioration. Electrodiffusion. Thin films. Interconnects (I...

Electromigration in thin films and electronic devices : materials and reliability : hardcover

Electromigration in thin films and electronic devices : materials and reliability : hardcover
Paper図書
edited by Choong-Un KimWoodhead Publishingc2011
Other Libraries in Japan
  • Subject Heading... Deterioration Electrodiffusion Thin films Interconnects (Int...
  • Subject Heading (ID)... Deterioration Electrodiffusion Thin films Interconnects (Int...

Advanced chromatographic and electromigration methods in biosciences

Advanced chromatographic and electromigration methods in biosciences
Paper図書
editor Zdenĕk Deyl ; co-editors Ivan Miksĭk, Franco Tagliaro, Eva Tesar̆ováElsevier1998
Other Libraries in Japan
  • Subject HeadingChromatographic analysis Life sciences -- Technique Electrodiffusion
  • Subject Heading (ID)Chromatographic analysis Life sciences -- Technique Electrodiffusion

Electromigration and electronic device degradation : cloth : alk. paper

Electromigration and electronic device degradation : cloth : alk. paper
Paper図書
edited by Aris ChristouWileyc1994
Other Libraries in Japan
  • Subject HeadingIntegrated circuits -- Deterioration Semiconductors -- Failures Electrodiffusion
  • Subject Heading (ID)Integrated circuits -- Deterioration Semiconductors -- Failures Electrodiffusion

Electro-diffusion of ions

Electro-diffusion of ions
Paper図書
Isaak RubinsteinSociety for Industrial and Applied Mathematics1990
Other Libraries in Japan
  • Subject HeadingIons -- Measurement Electrodiffusion Transport theory Nonlinear th...
  • Subject Heading (ID)Ions -- Measurement Electrodiffusion Transport theory Nonlinear th...

Atomic diffusion theory in highly defective solids

Atomic diffusion theory in highly defective solids
Paper図書
G. E. MurchTrans Tech SA1980
Other Libraries in Japan
  • Subject HeadingElectrodiffusion
  • Subject Heading (ID)Electrodiffusion

Materials reliability in microelectronics IX : symposium held April 6-8, 1999, San Francisco, California, U.S.A.

Materials reliability in microelectronics IX : symposium held April 6-8, 1999, San Francisco, California, U.S.A.
Paper図書
editors, Cynthia A. Volkert, Ad H. Verbruggen, Dirk D. BrownMaterials Research Societyc1999
Other Libraries in Japan
  • Subject Heading... -- Congresses Electrodiffusion -- Congresses Microstructure ...
  • Subject Heading (ID)... -- Congresses Electrodiffusion -- Congresses Microstructure ...

Materials reliability in microelectronics VIII : symposium held April 13-16, 1998, San Francisco, California, U.S.A.

Materials reliability in microelectronics VIII : symposium held April 13-16, 1998, San Francisco, California, U.S.A.
Paper図書
editors, John C. Bravman ... [et al.]Materials Research Societyc1998
Other Libraries in Japan
  • Subject Heading... -- Congresses Electrodiffusion -- Congresses Microstructure ...
  • Subject Heading (ID)... -- Congresses Electrodiffusion -- Congresses Microstructure ...

Materials reliability in microelectronics VII : symposium held April 8-12, 1997, San Francisco, California, U.S.A.

Materials reliability in microelectronics VII : symposium held April 8-12, 1997, San Francisco, California, U.S.A.
Paper図書
editors, J. Joseph Clement ... [et al.]Materials Research Societyc1997
Other Libraries in Japan
  • Subject Heading... -- Congresses Electrodiffusion -- Congresses Microstructure ...
  • Subject Heading (ID)... -- Congresses Electrodiffusion -- Congresses Microstructure ...

Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A.

Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A.
Paper図書
editors, William F. Filter ... [et al.]Materials Research Societyc1996
Other Libraries in Japan
  • Subject Heading... -- Congresses Electrodiffusion -- Congresses Microstructure ...
  • Subject Heading (ID)... -- Congresses Electrodiffusion -- Congresses Microstructure ...

Materials reliability in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A.

Materials reliability in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A.
Paper図書
editors, Anthony S. Oates ... [et. al.]Materials Research Societyc1995
Other Libraries in Japan
  • Subject Heading... -- Congresses Electrodiffusion -- Congresses Microstructure ...
  • Subject Heading (ID)... -- Congresses Electrodiffusion -- Congresses Microstructure ...

Ionic diffusion in oxide glasses

Ionic diffusion in oxide glasses
Paper図書
G. H. FrischatTrans Tech SA1975
Other Libraries in Japan
  • Subject HeadingElectrodiffusion
  • Subject Heading (ID)Electrodiffusion

Proceedings of the Symposium on Reliability of Metals in Electronics : pbk

Proceedings of the Symposium on Reliability of Metals in Electronics : pbk
Paper図書
edited by Hazara S. RathoreElectrochemical Societyc1995
Other Libraries in Japan
  • Subject Heading... -- Congresses Electrodiffusion -- Congresses
  • Subject Heading (ID)... -- Congresses Electrodiffusion -- Congresses

Materials reliability in microelectronics IV : symposium held April 5-8, 1994, San Francisco, California, U.S.A.

Materials reliability in microelectronics IV : symposium held April 5-8, 1994, San Francisco, California, U.S.A.
Paper図書
editors, Peter Børgesen ... [et. al.]Materials Research Societyc1994
Other Libraries in Japan
  • Subject Heading... -- Congresses Electrodiffusion -- Congresses Microstructure ...
  • Subject Heading (ID)... -- Congresses Electrodiffusion -- Congresses Microstructure ...

Electrotransport in metals and alloys

Electrotransport in metals and alloys
Paper図書
by J.N. Pratt and R.G.R. SellorsTrans Tech SA1973
Other Libraries in Japan
  • Subject HeadingElectrodiffusion
  • Subject Heading (ID)Electrodiffusion

Materials reliability in microelectronics III : symposium held April 12-15, 1993, San Francisco, California, U.S.A.

Materials reliability in microelectronics III : symposium held April 12-15, 1993, San Francisco, California, U.S.A.
Paper図書
editors, Kenneth P. Rodbell ... [et al.]Materials Research Societyc1993
Other Libraries in Japan
  • Subject Heading... -- Congresses Electrodiffusion -- Congresses Microstructure ...
  • Subject Heading (ID)... -- Congresses Electrodiffusion -- Congresses Microstructure ...

Submicrometer metallization : the challenges, opportunities, and limitations : 23-25 September 1992, San Jose, California

Submicrometer metallization : the challenges, opportunities, and limitations : 23-25 September 1992, San Jose, California
Paper図書
Thomas Kwok, Takamaro Kikkawa, Krishna Shenai, chairs/editors ; sponsored and published by SPIE--the International Society for Optical EngineeringSPIEc1993
Other Libraries in Japan
  • Subject Heading... -- Congresses Electrodiffusion -- Congresses Semiconductor-m...
  • Subject Heading (ID)... -- Congresses Electrodiffusion -- Congresses Semiconductor-m...

Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A.

Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A.
Paper図書
editors: C.V. Thompson, J.R. LloydMaterials Research Societyc1992
Other Libraries in Japan
  • Subject Heading... -- Congresses Electrodiffusion -- Congresses Microstructure ...
  • Subject Heading (ID)... -- Congresses Electrodiffusion -- Congresses Microstructure ...

Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A.

Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A.
Paper図書
editors, James R. Lloyd, Frederick G. Yost, Paul S. HoMaterials Research Societyc1991
Other Libraries in Japan
  • Subject Heading... -- Congresses Electrodiffusion -- Congresses Microstructure ...
  • Subject Heading (ID)... -- Congresses Electrodiffusion -- Congresses Microstructure ...
RSS