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Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry [microform] / A.R. Heyd ... [et al.] (NASA-TM ; 111685)

Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry [microform] / A.R. Heyd ... [et al.] (NASA-TM ; 111685)
Microform図書
1996<YCA-NAS 1.15:111685>
National Diet Library
  • Subject Heading... Superlattices Germanium compounds Ellipsometry Spectroscopic an...

Advanced gate stacks for high-mobility semiconductors hbk.

Advanced gate stacks for high-mobility semiconductors hbk.
Paper図書
A. Dimoulas ... [et al.] (eds.)Springerc2007
Other Libraries in Japan
  • Subject Heading...ry Dielectrics Germanium compounds
  • Subject Heading (ID)...ry Dielectrics Germanium compounds

SiGe based technologies : proceedings of Symposium on SiGe Based Technologies of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-4, 1992

SiGe based technologies : proceedings of Symposium on SiGe Based Technologies of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-4, 1992
Paper図書
edited by E. Kasper, Y. Shiraki, T.P. PearsallNorth-Holland1993, c1992
Other Libraries in Japan
  • Subject Heading... -- Congresses Germanium compounds -- Congresses Superlattices a...
  • Subject Heading (ID)... -- Congresses Germanium compounds -- Congresses Superlattices a...

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