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Electromigration in thin films and electronic devices : materials and reliability (Woodhead Publishing in materials)

Electromigration in thin films and electronic devices : materials and reliability (Woodhead Publishing in materials)
Paper図書
edited by Choong-Un Kim.Woodhead Publishing2011<ND386-B30>
National Diet Library

Electromigration in thin films and electronic devices : materials and reliability : hardcover

Electromigration in thin films and electronic devices : materials and reliability : hardcover
Paper図書
edited by Choong-Un KimWoodhead Publishingc2011
Other Libraries in Japan
  • Subject HeadingIntegrated circuits -- Deterioration Electrodiffusion Thin films I...
  • Subject Heading (ID)Integrated circuits -- Deterioration Electrodiffusion Thin films I...

Electromigration and electronic device degradation : cloth : alk. paper

Electromigration and electronic device degradation : cloth : alk. paper
Paper図書
edited by Aris ChristouWileyc1994
Other Libraries in Japan
  • Subject HeadingIntegrated circuits -- Deterioration Semiconductors -- Failures El...
  • Subject Heading (ID)Integrated circuits -- Deterioration Semiconductors -- Failures El...

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