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Reasoning in Boolean networks : logic synthesis and verification using testing techniques

Reasoning in Boolean networks : logic synthesis and verification using testing techniques
Paper図書
by Wolfgang Kunz and Dominik StoffelKluwer Academicc1997
Other Libraries in Japan
  • Subject HeadingIntegrated circuits -- Very large scale integration -- Testing -- Data processing Integrated circuits -- Verifi...
  • Subject Heading (ID)Integrated circuits -- Very large scale integration -- Testing -- Data processing Integrated circuits -- Verifi...

VLSI fault modeling and testing techniques

VLSI fault modeling and testing techniques
Paper図書
edited by George W. ZobristAblex Pub. Corp.c1993
Other Libraries in Japan
  • Subject HeadingIntegrated circuits -- Very large scale integration -- Testing -- Data processing Fault-tolerant computing
  • Subject Heading (ID)Integrated circuits -- Very large scale integration -- Testing -- Data processing Fault-tolerant computing

High-level test synthesis of digital VLSI circuits

High-level test synthesis of digital VLSI circuits
Paper図書
Mike Tien-Chien LeeArtech Housec1997
Other Libraries in Japan
  • Subject Heading...ata processing Integrated circuits -- Very large scale integration -- Testing -- Data processing Computer-aided design Digital...
  • Subject Heading (ID)...ata processing Integrated circuits -- Very large scale integration -- Testing -- Data processing Computer-aided design Digital...

An artificial intelligence approach to test generation

An artificial intelligence approach to test generation
Paper図書
by Narinder SinghKluwer Academic Publishersc1987
Other Libraries in Japan
  • Subject HeadingIntegrated circuits -- Very large scale integration -- Testing -- Data processing Expert systems (Computer scie...
  • Subject Heading (ID)Integrated circuits -- Very large scale integration -- Testing -- Data processing Expert systems (Computer scie...

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