IEEE[2014]<M17-15-2304>
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- Subject Heading...uits--Testing. Microelectronics--Design. Nanotechnology. Systems on a ...
IEEEc2013.<M17-14-334>
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IEEEc2011.<M17-12-1288>
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IEEEc2009.<M17-10-2540>
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Institute of Electrical and Electronics Engineersc2006.<M17-07-2512>
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Werner Karl SchomburgSpringerc2011
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Michael P. GaynorArtech Housec2007
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edited by G.Q. Zhang, L.J. Ernst, O. de Saint LegerKluwer Academic Publishersc2000
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editors, Adam Osseiran ... [et al.] ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), IEEE Hong Kong ED/SSC Joint Chapter, Hong Kong University of Science and TechnologyIEEE Computer Societyc2008
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edited by Patrick Girard, Adam Osseiran, and Moi-Tin Chew ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), IEEE Malaysia Section, Monash University, Malaysia ; with industrial co-sponsorship from National Instruments ; in cooperation with Freescale Semiconductor Malaysia ... [et al.]IEEE Computer Societyc2006
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Marc MadouCRC Pressc1997
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Peter A. Sandborn, Hector MorenoKluwer Academicc1994
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edited by James E. MorrisIEEE Pressc1994
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by M. Sriram, S.M. KangKluwer Academic Publishersc1994
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[edited by] Michael PechtWileyc1994
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editors, R.A. Adey, A. Lahrmann, C. LessmölmannComputational Mechanicsc1995
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Naveed A. Sherwani, Siddharth Bhingarde, Anand PanyamIEEE Pressc1995
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Dim-Lee Kwong, Heinrich G. Müller, chairs/editors ; sponsored and published by SPIE--the International Society for Optical EngineeringSPIEc1993
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