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Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A. / editors, Noble M. Johnson, Stephen G. Bishop, George D. Watkins. (Materials Research Society symposia proceedings ; v. 46)

Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A. / editors, Noble M. Johnson, Stephen G. Bishop, George D. Watkins. (Materials Research Society symposia proceedings ; v. 46)
Paper図書
Materials Research Societyc1985.<M15-A4582>
National Diet LibraryOther Libraries in Japan
  • Subject HeadingSemiconductors -- Defects -- Congresses. Microscope and microscopy -- Congresses.

Microscopy of semiconducting materials, 1981 : proceedings of the Royal Microscopical Society Conference held in St. Catherine's College, Oxford, 6-10 April 1981 / Edited by A. G. Cullis and D. C. Joy. (Conference series ; no. 60)

Microscopy of semiconducting materials, 1981 : proceedings of the Royal Microscopical Society Conference held in St. Catherine's College, Oxford, 6-10 April 1981 / Edited by A. G. Cullis and D. C. Joy. (Conference series ; no. 60)
Paper図書
The Institute of Physicsc1981.<MC151-48>
National Diet Library
  • Subject HeadingSemiconductors -- Congresses. Microscope and microscopy -- Congresses.

Micro 90 : proceedings of the Royal Microscopical Society Conference, held in London, 2-6 July 1990

Micro 90 : proceedings of the Royal Microscopical Society Conference, held in London, 2-6 July 1990
Paper図書
edited by H.Y. ElderA. Hilgerc1990
Other Libraries in Japan

Advances in microscopy : proceedings of the American Microscopical Society Symposium, held in Philadelphia, Pennsylvania, December 28, 1983

Advances in microscopy : proceedings of the American Microscopical Society Symposium, held in Philadelphia, Pennsylvania, December 28, 1983
Paper図書
editors, Ronald R. Cowden, Frederick W. HarrisonA.R. Lissc1985
Other Libraries in Japan

Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.

Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A.
Paper図書
editors, Noble M. Johnson, Stephen G. Bishop, George D. WatkinsMaterials Research Societyc1985
Other Libraries in Japan

Quantitative electron microscopy : Proceedings of a symposium on "Quantitative electron microscopy" held at the armed forces institute of pathology, Washington, D. C , march 30 through April 3, 1964

Quantitative electron microscopy : Proceedings of a symposium on "Quantitative electron microscopy" held at the armed forces institute of pathology, Washington, D. C , march 30 through April 3, 1964
Paper図書
sponsored jointly by the Intersociety Committee for Research Potential in Pathology, Inc. and the Armed Forces Institute of Pathology ; organized and edited by Gunter F. Bahr and Elmar H. Zeitler[s.n.][19--]
Other Libraries in Japan

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