yr 〜
yr

Search results 8

2016 IEEE 21st international mixed-signal testing workshop : (IMSTW 2016) : Sant Feliu de Guixols, Spain : 4-6 July 2016 : 2016 IEEE 21st international mixed-signals test workshop : 21st IEEE international mixed signal testing workshop : Jul 2016, Sant Feliu de Guixols, Spain.

2016 IEEE 21st international mixed-signal testing workshop : (IMSTW 2016) : Sant Feliu de Guixols, Spain : 4-6 July 2016 : 2016 IEEE 21st international mixed-signals test workshop : 21st IEEE international mixed signal testing workshop : Jul 2016, Sant Feliu de Guixols, Spain.
Paper図書
IEEE[2016]<M17-18-977>
National Diet Library
  • Subject HeadingMixed signal circuits--Testing--Congresses. Mixed signal circuits--Testing.

2015 20th international mixed-signals testing workshop : (IMSTW 2015) : Paris, France : 24-26 June 2015 : 2015 IEEE 20th international mixed-signals test workshop : Jun 2015, Paris, France.

2015 20th international mixed-signals testing workshop : (IMSTW 2015) : Paris, France : 24-26 June 2015 : 2015 IEEE 20th international mixed-signals test workshop : Jun 2015, Paris, France.
Paper図書
IEEE[2015]<M17-17-1404>
National Diet Library
  • Subject HeadingMixed signal circuits--Testing--Congresses. Mixed signal circuits--Testing.

Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach pbk

Test and diagnosis of analogue, mixed-signal and RF integrated circuits : the system on chip approach pbk
Paper図書
edited by Yichuang SunThe Institution of Engineering and Technology2008
Other Libraries in Japan

Test and design-for-testability in mixed-signal integrated circuits

Test and design-for-testability in mixed-signal integrated circuits
Paper図書
edited by José L. HuertasKluwer Academicc2004
Other Libraries in Japan

An introduction to mixed-signal IC test and measurement

An introduction to mixed-signal IC test and measurement
Paper図書
Mark Burns, Gordon W. RobertsOxford University Press2001
Other Libraries in Japan

Analog and mixed-signal test

Analog and mixed-signal test
Paper図書
ed. by Bapiraju VinnakotaPrentice Hall PTRc1998
Other Libraries in Japan

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits

Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
Paper図書
Michael L. Bushnell, Vishwani D. AgrawalKluwer Academicc2000
Other Libraries in Japan

Analog and mixed-signal boundary-scan : a guide to the IEEE 1149.4 test standard

Analog and mixed-signal boundary-scan : a guide to the IEEE 1149.4 test standard
Paper図書
edited by Adam OsseiranKluwer Academic Publishers1999
Other Libraries in Japan

Reached to the end of result.