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Electron Microscopy and Analysis Group conference : (EMAG 2013) : York, United Kingdom : 3-6 September 2013 : Howie symposium : EMAG2013 : Sep 2013, York, UK. (Journal of Physics: Conference Series ; 522)

Electron Microscopy and Analysis Group conference : (EMAG 2013) : York, United Kingdom : 3-6 September 2013 : Howie symposium : EMAG2013 : Sep 2013, York, UK. (Journal of Physics: Conference Series ; 522)
Paper図書
Institute of Physics[2014]<M17-15-180>
National Diet Library

Electron Microscopy and Analysis Group conference 2011 : (EMAG 2011) : Birmingham, United Kingdom : 6-9 September 2011 : biennial EMAG conference : Sep 2011, Birmingham, UK. (Journal of Physics: Conference Series ; 371)

Electron Microscopy and Analysis Group conference 2011 : (EMAG 2011) : Birmingham, United Kingdom : 6-9 September 2011 : biennial EMAG conference : Sep 2011, Birmingham, UK. (Journal of Physics: Conference Series ; 371)
Paper図書
Institute of Physicsc2011.<M17-13-2800>
National Diet Library

Scanning probe microscopy in nanoscience and nanotechnology / Bharat Bhushan, editor. (Nanoscience and technology)

Scanning probe microscopy in nanoscience and nanotechnology / Bharat Bhushan, editor. (Nanoscience and technology)
Paper図書
Springerc2010.<ND448-B7>
National Diet Library
  • Subject HeadingScanning probe microscopy. Nanostructured materials -- Microscopy. Nanostrukturiertes Material. ...

Conductive atomic force microscopy : applications in nanomaterials : hbk

Conductive atomic force microscopy : applications in nanomaterials : hbk
Paper図書
edited by Mario LanzaWiley-VCHc2017
Other Libraries in Japan

In-situ materials characterization : across spatial and temporal scales

In-situ materials characterization : across spatial and temporal scales
Paper図書
Alexander Ziegler, Heinz Graafsma, Xiao Feng Zhang, Joost W.M. Frenken, editorsSpringerc2014
Other Libraries in Japan

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