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Optical fiber power meter nonlinearity calibrations at NIST [microform] / Igor Vayshenker ... [et al.] (NIST special publication ; 250-56) (NIST measurement services)

Optical fiber power meter nonlinearity calibrations at NIST [microform] / Igor Vayshenker ... [et al.] (NIST special publication ; 250-56) (NIST measurement services)
Microform図書
2000<YCA-C 13.10:250-56>
National Diet Library
  • Subject Heading... United States Optoelectronic devices -- Calibration -- United States Scientific apparatus and inst...

Optical fiber power meter calibrations at NIST [microform] / Igor Vayshenker ... [et al.] (NIST special publication ; 250-54) (NIST measurement services)

Optical fiber power meter calibrations at NIST [microform] / Igor Vayshenker ... [et al.] (NIST special publication ; 250-54) (NIST measurement services)
Microform図書
2000<YCA-C 13.10:250-54>
National Diet Library
  • Subject Heading... United States Optoelectronic devices -- Calibration -- United States Scientific apparatus and inst...

Calibration service of optoelectronic frequency response at 1319 nm for combined photodiode/RF power sensor transfer standards [microform] / Paul D. Hale and C.M. Wang (NIST special publication ; 250-51) (NIST measurement services)

Calibration service of optoelectronic frequency response at 1319 nm for combined photodiode/RF power sensor transfer standards [microform] / Paul D. Hale and C.M. Wang (NIST special publication ; 250-51) (NIST measurement services)
Microform図書
1999<YCA-C 13.10:250-51>
National Diet Library
  • Subject Heading... United States Optoelectronic devices -- Calibration -- United States Scientific apparatus and inst...

Calibration service for spectral responsivity of laser and optical-fiber power meters at wavelengths between 0.4 [micrometers] and 1.8 [micrometers] [microform] / John H. Lehman (NIST special publication ; 250-23. NIST measurement services)

Calibration service for spectral responsivity of laser and optical-fiber power meters at wavelengths between 0.4 [micrometers] and 1.8 [micrometers] [microform] / John H. Lehman (NIST special publication ; 250-23. NIST measurement services)
Microform図書
1999<YCA-C 13.10:250-53>
National Diet Library
  • Subject HeadingOptoelectronic devices -- Calibration -- United States Optical detectors -- Calibrat...

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