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The boundary-scan handbook Fourth edition.

The boundary-scan handbook Fourth edition.
Paper図書
Kenneth P. Parker.Springer[2016]<ND541-B9>
National Diet Library

The boundary-scan handbook / by Kenneth P. Parker. 3rd ed.

The boundary-scan handbook / by Kenneth P. Parker. 3rd ed.
Paper図書
Kluwer Academic Publishersc2003.<ND541-B1>
National Diet Library
  • Subject HeadingPrinted circuits -- Testing. Printed circuits -- Testing -- Standards. Boundary scan t...

The boundary-scan handbook 3rd ed.

The boundary-scan handbook 3rd ed.
Paper図書
by Kenneth P. ParkerKluwer Academic Publishersc2003
Other Libraries in Japan
  • Subject HeadingPrinted circuits -- Testing Printed circuits -- Testing -- Standards Boundary scan te...
  • Subject Heading (ID)Printed circuits -- Testing Printed circuits -- Testing -- Standards Boundary scan te...

The boundary-scan handbook : analog and digital 2nd ed

The boundary-scan handbook : analog and digital 2nd ed
Paper図書
by Kenneth P. ParkerKluwer Academic Publishersc1998
Other Libraries in Japan
  • Subject HeadingPrinted circuits -- Testing Printed circuits -- Testing -- Standards Boundary scan te...
  • Subject Heading (ID)Printed circuits -- Testing Printed circuits -- Testing -- Standards Boundary scan te...

Evaluation of conformal coatings for future spacecraft applications

Evaluation of conformal coatings for future spacecraft applications
Paper図書
B.D. Dunn, P. DesplatESA Publications Division, ESTECc1994
Other Libraries in Japan
  • Subject Heading... -- Protection Printed circuits -- Testing Protective coatings
  • Subject Heading (ID)... -- Protection Printed circuits -- Testing Protective coatings

The Boundary-Scan handbook

The Boundary-Scan handbook
Paper図書
by Kenneth P. ParkerKluwer Academic Publishersc1992
Other Libraries in Japan
  • Subject HeadingPrinted circuits -- Testing Printed circuits -- Testing -- Standards Boundary scan te...
  • Subject Heading (ID)Printed circuits -- Testing Printed circuits -- Testing -- Standards Boundary scan te...

Strategies for electronics test :pbk.

Strategies for electronics test :pbk.
Paper図書
Craig Pynn, Zehntel, IncMcGraw-Hillc1986
Other Libraries in Japan
  • Subject HeadingPrinted circuits -- Testing
  • Subject Heading (ID)Printed circuits -- Testing

In-circuit testing

In-circuit testing
Paper図書
John BatesonVan Nostrand Reinholdc1985
Other Libraries in Japan
  • Subject HeadingPrinted circuits -- Testing
  • Subject Heading (ID)Printed circuits -- Testing

Analog and mixed-signal boundary-scan : a guide to the IEEE 1149.4 test standard

Analog and mixed-signal boundary-scan : a guide to the IEEE 1149.4 test standard
Paper図書
edited by Adam OsseiranKluwer Academic Publishers1999
Other Libraries in Japan
  • Subject HeadingPrinted circuits -- Testing -- Standards Boundary scan te...
  • Subject Heading (ID)Printed circuits -- Testing -- Standards Boundary scan te...

Introduction to digital board testing

Introduction to digital board testing
Paper図書
R.G. BennettsCrane, Russakc1982
Other Libraries in Japan
  • Subject HeadingDigital integrated circuits -- Testing Printed circuits -- Testing
  • Subject Heading (ID)Digital integrated circuits -- Testing Printed circuits -- Testing

LSI & boards : digest of papers, 1978 Semiconductor Test Conference, October 31, November 1, 2, 1978, held at Cherry Hill, New Jersey

LSI & boards : digest of papers, 1978 Semiconductor Test Conference, October 31, November 1, 2, 1978, held at Cherry Hill, New Jersey
Paper図書
sponsored by IEEE Computer Society, Test Technology Committee and the Philadelphia Section of the IEEEInstitute of Electrical and Electronics Engineersc1978
Other Libraries in Japan
  • Subject Heading... -- Congresses Printed circuits -- Testing -- Congresses
  • Subject Heading (ID)... -- Congresses Printed circuits -- Testing -- Congresses

LSI & boards : digest of papers, 1979 Test Conference, October 23, 24 & 25, 1979, held at Cherry Hill, New Jersey

LSI & boards : digest of papers, 1979 Test Conference, October 23, 24 & 25, 1979, held at Cherry Hill, New Jersey
Paper図書
sponsored by IEEE Computer Society, Test Technology Committee, and the Philadelphia Section of the IEEEInstitute of Electrical and Electronics Engineersc1979
Other Libraries in Japan
  • Subject Heading... -- Congresses Printed circuits -- Testing -- Congresses Semiconductors ...
  • Subject Heading (ID)... -- Congresses Printed circuits -- Testing -- Congresses Semiconductors ...

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