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The practice of TOF-SIMS : time of flight secondary ion mass spectrometry : print

The practice of TOF-SIMS : time of flight secondary ion mass spectrometry : print
Paper図書
Alan M. SpoolMomentum Pressc2016
Other Libraries in Japan
  • Subject HeadingTime-of-flight mass spectrometry Secondary ion mass spectrometry
  • Subject Heading (ID)Time-of-flight mass spectrometry Secondary ion mass spectrometry

7th International SHRIMP Workshop

7th International SHRIMP Workshop
Paper図書
[National Institute of Polar Research][2014]
Other Libraries in Japan
  • Subject HeadingSecondary ion mass spectrometry Earth sciences Geological sci...
  • Subject Heading (ID)Secondary ion mass spectrometry Earth sciences Geological sci...

Secondary ion mass spectrometry : an introduction to principles and practices hrd.

Secondary ion mass spectrometry : an introduction to principles and practices hrd.
Paper図書
Paul van der HeideJohn Wiley & Sons, Inc.c2014
Other Libraries in Japan
  • Subject HeadingSecondary ion mass spectrometry SCIENCE / Chemistry / Analyti...
  • Subject Heading (ID)Secondary ion mass spectrometry SCIENCE / Chemistry / Analyti...

Handbook of static secondary ion mass spectrometry / D. Briggs, A. Brown, and J.C. Vickerman.

Handbook of static secondary ion mass spectrometry / D. Briggs, A. Brown, and J.C. Vickerman.
Paper図書
J. Wileyc1989.<PA2-A60>
National Diet LibraryOther Libraries in Japan
  • Subject Heading質量分析. イオン. Secondary ion mass spectrometry.
  • Alternative TitleStatic secondary ion mass spectrometry.
  • Alternative TitleStatic secondary ion mass spectrometry.

Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications, and trends / A. Benninghoven, F.G. Rüdenauer, H.W. Werner. (Chemical analysis ; v. 86)

Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications, and trends / A. Benninghoven, F.G. Rüdenauer, H.W. Werner. (Chemical analysis ; v. 86)
Paper図書
J. Wiley1987.<PA124-A9>
National Diet LibraryOther Libraries in Japan
  • Subject Heading質量分析. イオン衝撃. Secondary ion mass spectrometry.

SHRIMP Workshop 2003

SHRIMP Workshop 2003
Paper図書
[Research School of Earth Sciences][2003]
Other Libraries in Japan
  • Subject HeadingSecondary ion mass spectrometry Earth sciences Geological sci...
  • Subject Heading (ID)Secondary ion mass spectrometry Earth sciences Geological sci...

Surface analysis of polymers by XPS and static SIMS : pbk Digitally printed first paperback version

Surface analysis of polymers by XPS and static SIMS : pbk Digitally printed first paperback version
Paper図書
D. BriggsCambridge University Press2005, c1998
Other Libraries in Japan
  • Subject HeadingPolymers -- Surfaces -- Analysis X-ray spectroscopy Secondary ion mass spectrometry
  • Subject Heading (ID)Polymers -- Surfaces -- Analysis X-ray spectroscopy Secondary ion mass spectrometry

New trends and potentialities of ToF-SIMS in surface studies

New trends and potentialities of ToF-SIMS in surface studies
Paper図書
Jacek GramsNova Science Publishersc2007
Other Libraries in Japan
  • Subject HeadingSecondary ion mass spectrometry -- Research Time-of-flight ma...
  • Subject Heading (ID)Secondary ion mass spectrometry -- Research Time-of-flight ma...

Surface analysis of polymers by XPS and static SIMS hc

Surface analysis of polymers by XPS and static SIMS hc
Paper図書
D. BriggsCambridge University Press1998
Other Libraries in Japan
  • Subject HeadingPolymers -- Surfaces -- Analysis X-ray spectroscopy Secondary ion mass spectrometry
  • Subject Heading (ID)Polymers -- Surfaces -- Analysis X-ray spectroscopy Secondary ion mass spectrometry

Ion formation from organic solids : proceedings of the second international conference, Münster, Fed. Rep. of Germany, September 7-9, 1982 / editor, A. Benninghoven. (Springer series in chemical physics ; v. 25)

Ion formation from organic solids : proceedings of the second international conference, Münster, Fed. Rep. of Germany, September 7-9, 1982 / editor, A. Benninghoven. (Springer series in chemical physics ; v. 25)
Paper図書
Springer-Verlag1983.<M15-A539>
National Diet Library
  • Subject Heading...-- Congresses. Secondary ion mass spectrometry -- Congresses. Organic compou...

Secondary ion mass spectrometry

Secondary ion mass spectrometry
Paper図書
editors A. Benninghoven ... [et al.]Wiley1990
Other Libraries in Japan
  • Subject HeadingSecondary ion mass spectrometry
  • Subject Heading (ID)Secondary ion mass spectrometry
  • Author HeadingInternational Conference on Secondary Ion Mass Spectrometry (7th : 1989 : Monterey, Calif...

Secondary ion mass spectrometry : SIMS XI : proceedings of the Eleventh International Conference on Secondary Ion Mass Spectrometry, Orlando, Florida, September 7-12th, 1997

Secondary ion mass spectrometry : SIMS XI : proceedings of the Eleventh International Conference on Secondary Ion Mass Spectrometry, Orlando, Florida, September 7-12th, 1997
Paper図書
editors, G. Gillen ... [et al.]Wileyc1998
Other Libraries in Japan
  • Subject HeadingSecondary ion mass spectrometry -- Congresses
  • Subject Heading (ID)Secondary ion mass spectrometry -- Congresses
  • Author HeadingInternational Conference on Secondary Ion Mass Spectrometry Gillen, G.

Secondary ion mass spectrometry : SIMS X : Proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X) : University of Muenster, Muenster, Germany October 1-6th, 1995

Secondary ion mass spectrometry : SIMS X : Proceedings of the Tenth International Conference on Secondary Ion Mass Spectrometry (SIMS X) : University of Muenster, Muenster, Germany October 1-6th, 1995
Paper図書
editors, A. Benninghoven ... [et al.]Wileyc1997
Other Libraries in Japan
  • Subject HeadingSecondary ion mass spectrometry -- Congresses
  • Subject Heading (ID)Secondary ion mass spectrometry -- Congresses
  • Author HeadingInternational Conference on Secondary Ion Mass Spectrometry Benninghoven, A.

Secondary ion mass spectrometry : SIMS VI

Secondary ion mass spectrometry : SIMS VI
Paper図書
editors A. Benninghoven, A.M. Huber, H.W. WernerWileyc1988
Other Libraries in Japan
  • Subject HeadingSecondary ion mass spectrometry
  • Subject Heading (ID)Secondary ion mass spectrometry
  • Author HeadingInternational Conference on Secondary Ion Mass Spectrometry Benninghoven, A. Huber, A. M....

Secondary ion mass spectrometry : principles and applications

Secondary ion mass spectrometry : principles and applications
Paper図書
edited by John C. Vickerman, Alan Brown, and Nicola M. ReedClarendon Press1989
Other Libraries in Japan
  • Subject HeadingSecondary ion mass spectrometry
  • Subject Heading (ID)Secondary ion mass spectrometry

Secondary ion mass spectrometry : a practical handbook for depth profiling and bulk impurity analysis

Secondary ion mass spectrometry : a practical handbook for depth profiling and bulk impurity analysis
Paper図書
R.G. Wilson, F.A. Stevie, C.W. MageeWileyc1989
Other Libraries in Japan
  • Subject HeadingSecondary ion mass spectrometry
  • Subject Heading (ID)Secondary ion mass spectrometry

Handbook of static secondary ion mass spectrometry

Handbook of static secondary ion mass spectrometry
Paper図書
D. Briggs, A. Brown, and J.C. VickermanJ. Wileyc1989
Other Libraries in Japan
  • Subject HeadingSecondary ion mass spectrometry
  • Subject Heading (ID)Secondary ion mass spectrometry
  • Alternative TitleStatic secondary ion mass spectrometry

Ion spectroscopies for surface analysis

Ion spectroscopies for surface analysis
Paper図書
edited by A.W. Czanderna and David M. HerculesPlenum Pressc1991
Other Libraries in Japan
  • Subject HeadingSolids -- Surfaces -- Analysis Secondary ion mass spectrometry Surface chemistry
  • Subject Heading (ID)Solids -- Surfaces -- Analysis Secondary ion mass spectrometry Surface chemistry

A Simple Theoretical Approach to Determine Relative Ion Yield (RIY) in Glow Discharge Mass Spectrometry (GDMS)

A Simple Theoretical Approach to Determine Relative Ion Yield (RIY) in Glow Discharge Mass Spectrometry (GDMS)
Digital文書・図像類
BORN, Sabine, MATSUNAMI, Noriaki, TAWARA, HiroyukiNational Institute for Fusion Science2000-01Research Report NIFS-Series
Other Libraries in Japan
  • Subject Headingglow discharge secondary ion mass spectrometry relative ion yield electron i...

Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications and trends

Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications and trends
Paper図書
A. Benninghoven, F.G. Rüdenauer, H.W. WernerJohn Wiley & Sonsc1987
Other Libraries in Japan
  • Subject HeadingSecondary ion mass spectrometry
  • Subject Heading (ID)Secondary ion mass spectrometry
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