yr 〜
yr

Search results 2

ＬＳＩ歩留まり向上のための誤テスト回避型テスト方式に関する研究

ＬＳＩ歩留まり向上のための誤テスト回避型テスト方式に関する研究
Digital文書・図像類
温, 暁青九州工業大学2007-05
Other Libraries in Japan
  • Subject HeadingLST Testing Power Aware Testing DFT Fault Diagnosis Low Power Testing

Studies on power constrained test techniques for VLSI circuits

Studies on power constrained test techniques for VLSI circuits
Digital博士論文
尤, 志強Nara Institute of Science and Technology2006-03-24
Other Libraries in Japan
  • Subject Heading...t-in self-test low power testing test scheduling full scan tes...

Reached to the end of result.