Search results for "ARPA/NBS workshop III. test patterns for integrated circuits" | NDL Search

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1970s(1)

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ARPA/NBS workshop III. test patterns for integrated circuits 400-15

Digital図書

Harry A. Schafft, editorU.S. G.P.O.1976

Other Libraries in Japan

NBS special publication

Paper図書

Planning Office, National Bureau of Standards, U.S. Dept. of Commerce

Other Libraries in Japan

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