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Development of a new analysis method in two-dimensional reciprocal space map and evaluation of surface atomic arrangement in three-dimensionally nano-fabricated materials using diffraction

Development of a new analysis method in two-dimensional reciprocal space map and evaluation of surface atomic arrangement in three-dimensionally nano-fabricated materials using diffraction
Digital博士論文障害者向け資料あり
Shouhei, TakemotoNara Institute of Science and Technology2018-09-30
Available onlineNational Diet LibraryOther Libraries in Japan

Exploiting reciprocal space : electron diffraction, textures and precession

Exploiting reciprocal space : electron diffraction, textures and precession
Paper博士論文
Peter Oleynikov.Stockholms Universitet2006.<M-DISS-502>
National Diet Library

Structural characterization of ferroelectric thin film by X-ray diffraction reciprocal space mapping

Structural characterization of ferroelectric thin film by X-ray diffraction reciprocal space mapping
Paper博士論文
Keisuke Saito [著][Keisuke Saito][2003]<UT51-2004-U363>
National Diet Library

Reciprocal space analysis of the initial stages of strain relaxation in SiGe epilayers SAND-96-0081C DE96 004646 CONF-95115526

Reciprocal space analysis of the initial stages of strain relaxation in SiGe epilayers SAND-96-0081C DE96 004646 CONF-95115526
Microform規格・テクニカルリポート類
Lee, S. R, Floro, J. A1996<LS-DE96/004646>
National Diet Library

Reciprocal space analysis of the microstructure of luminescent and nonluminescent porous silicon films SAND-94-1736C DE95 005420 CONF-94114442

Reciprocal space analysis of the microstructure of luminescent and nonluminescent porous silicon films SAND-94-1736C DE95 005420 CONF-94114442
Microform規格・テクニカルリポート類
Lee, S. R, Barbour, J. C, Medernach, J. W, Stevenson, J. O, Custer, J. S1994<LS-DE95/005420>
National Diet Library

Reciprocal space mapping of epitaxial materials using position-sensitive x-ray detection SAND-94-1071C DE95 001620 CONF-94081781

Reciprocal space mapping of epitaxial materials using position-sensitive x-ray detection SAND-94-1071C DE95 001620 CONF-94081781
Microform規格・テクニカルリポート類
Lee, S. R, Doyle, B. L, Drummond, T. J, Medernach, J. W, Schneider, R. P1994<LS-DE95/001620>
National Diet Library

Reciprocal space 3rd ed., repr.

Reciprocal space 3rd ed., repr.
Paper図書
edited by U. ShmueliPublished for the International Union of Crystallography by Wiley2015
Other Libraries in Japan

Reciprocal space 3rd ed

Reciprocal space 3rd ed
Paper図書
edited by U. ShmueliPublished for the International Union of Crystallography by Springer2008
Other Libraries in Japan

Reciprocal space 2nd ed

Reciprocal space 2nd ed
Paper図書
edited by U. ShmueliPublished for the International Union of Crystallography by Kluwer Academic Publishers2001
Other Libraries in Japan

In situ synchrotron X-ray reciprocal space mapping during InGaN/GaN heterostructure nanowire growth

In situ synchrotron X-ray reciprocal space mapping during InGaN/GaN heterostructure nanowire growth
Paper文書・図像類
上杉, 智洋, 佐々木, 拓生, 杉谷, 寛弥, 高橋, 正光, Uesugi, Tomohiro, Sasaki, Takuo, Sugitani, Kanya, Takahashi, Masamitsu2019-05-20
Other Libraries in Japan
  • Summary, etc.In situ synchrotron X-ray reciprocal space mapping was carried out to in...

Reciprocal space repr. with corr.

Reciprocal space repr. with corr.
Paper図書
edited by U. ShmueliPublished for the International Union of Crystallography by Kluwer Academic Publishers1996
Other Libraries in Japan

Real-time structural analysis of InGaAs/InAs/GaAs(111)A interfaces by in situ synchrotron X-ray reciprocal space mapping

Real-time structural analysis of InGaAs/InAs/GaAs(111)A interfaces by in situ synchrotron X-ray reciprocal space mapping
Paper文書・図像類
佐々木, 拓生, 高橋, 正光, 佐々木 拓生, 高橋 正光2018-09-03
Other Libraries in Japan
  • Summary, etc.In situ synchrotron X-ray reciprocal space mapping was employed for stud...

Strain Relaxation Analysis Using In-situ X-ray Reciprocal Space Mapping Measurements in RF-MBE Growth of GaInN

Strain Relaxation Analysis Using In-situ X-ray Reciprocal Space Mapping Measurements in RF-MBE Growth of GaInN
Paper文書・図像類
T., Yamaguchi (工学院大）, 佐々木, 拓生, 高橋, 正光, T., Honda（工学院大）, T., Onuma（工学院大）, Y., Nanishi（立命館大）, 佐々木 拓生, 高橋 正光2016-08-09
Other Libraries in Japan

Reciprocal space

Reciprocal space
Paper図書
edited by U. ShmueliPublished for the International Union of Crystallography by Kluwer Academic Publishers1993
Other Libraries in Japan

RECIPROCAL SPACE ANALYSIS OF THE INITIAL STAGES OF STRAIN RELAXATION IN SIGE EPILAYERS (SAND ; SAND-96-0081C)

RECIPROCAL SPACE ANALYSIS OF THE INITIAL STAGES OF STRAIN RELAXATION IN SIGE EPILAYERS (SAND ; SAND-96-0081C)
Paper図書
LEE, S.R.// FLORO, J.A. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1996.
Other Libraries in Japan

RECIPROCAL SPACE ANALYSIS OF THE MICROSTRUCTURE OF LUMINESCENT AND NONLUMINESCENT POROUS SILICON FILMS (SAND ; SAND-94-1736C)

RECIPROCAL SPACE ANALYSIS OF THE MICROSTRUCTURE OF LUMINESCENT AND NONLUMINESCENT POROUS SILICON FILMS (SAND ; SAND-94-1736C)
Paper図書
LEE, S.R.// BARBOUR, J.C.// MEDERNACH, J.W.// STEVENSON, J.O.// CUSTER, J.S. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan

RECIPROCAL SPACE MAPPING OF EPITAXIAL MATERIALS USING POSITION- SENSITIVE X-RAY DETECTION (SAND ; SAND-94-1071C)

RECIPROCAL SPACE MAPPING OF EPITAXIAL MATERIALS USING POSITION- SENSITIVE X-RAY DETECTION (SAND ; SAND-94-1071C)
Paper図書
LEE, S.R.// DOYLE, B.L.// DRUMMOND, T.J.// MEDERNACH, J.W.// SCHNEIDER, R.P. JR. (SANDIA NATIONAL LABS., ALBUQUERQUE, NM (UNITED STATES))Sandia National Laboratories(Sandia National Laboratories)1994.
Other Libraries in Japan

RECIPROCAL SPACE APPROACH FOR LOCATING SYMMETRY ELEMENTS IN PATTERSON SUPERPOSITION MAPS. (IS ; IS-T-1408)

RECIPROCAL SPACE APPROACH FOR LOCATING SYMMETRY ELEMENTS IN PATTERSON SUPERPOSITION MAPS. (IS ; IS-T-1408)
Paper図書
HENDRIXSON, T.Ames Laboratory(Ames Laboratory)1990.
Other Libraries in Japan

Structure of materials : an introduction to crystallography, diffraction and symmetry / Marc De Graef, Michael E. McHenry.

Structure of materials : an introduction to crystallography, diffraction and symmetry / Marc De Graef, Michael E. McHenry.
Paper図書
Cambridge University Press2007.<MC145-B21>
National Diet Library
  • Contents...Lattice planes Reciprocal space Additional crystallographic c...

International tables for crystallography. 3rd ed.

International tables for crystallography. 3rd ed.
Paper図書
Published for the International Union of Crystallography by Kluwer Academic2004-<MC2-B10>
National Diet LibraryOther Libraries in Japan
  • Contentsv. B. Reciprocal space / edited by U. Shmueli v. C. ...
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