並列タイトル等Aggregation of Cu+ Ions in Heavily Cu+ -Doped Metal Halide Films Studied by UV Absorption Spectroscopy
一般注記Annealing behavior of quench-deposited films of Nax, KX, TIX and PbX2 (X=Br, CL) heavily doped with Cu+ ions have been studied by in situ observation of Cu+ -ion impurity absorption and CuX exciton absorption. In the as-deposited NaX and KX films, the Cu+ ions are substituted for the host cations, forming isolated impurity centers. On annealing the films, the Cu+ ions migrate to form CuX nanocrystals for NaX and K2CuX3 microcrystals for KX. In the case of TIX, no traces of Cu+ -ion centers are detected both for the as-deposited and annealed films. In the as-deposited PbX2 films, the Cu+ ions exist as dimmers forming quasicomplexes of from [Cu2X9]7- in the amorphous PbX2 surroundings. Upon crystallization of the surroundings, the Cu+ dimmers aggregate to from CuX precipitates embedded in the crystalline PbX2 matrix.
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連携機関・データベース国立情報学研究所 : 学術機関リポジトリデータベース(IRDB)(機関リポジトリ)